1987
DOI: 10.1016/0254-0584(87)90150-7
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The application of the pore-filling method to the study of the structure of porous anodic films on aluminium

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Cited by 4 publications
(6 citation statements)
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“…From cross‐sectional FEG‐SEM views, the thickness of the anodic film (Figure ) and the thickness of the barrier layer (Figure ) were first determined. Figure shows in particular that the film thickness changes little (slope 1) at the beginning of the voltage ramp (from 0 to 320 s, ie, from 0 to 16 V), whereas it increases significantly (slope 2), especially during the steady state, ie, after 320 seconds, for a voltage value at 16 V. In contrast, the thickness of the barrier layer regularly increases (slope 3) both during the transient regime (the voltage ramp) and during the steady‐state voltage regime (Figure ), in agreement with previous works …”
Section: Resultssupporting
confidence: 91%
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“…From cross‐sectional FEG‐SEM views, the thickness of the anodic film (Figure ) and the thickness of the barrier layer (Figure ) were first determined. Figure shows in particular that the film thickness changes little (slope 1) at the beginning of the voltage ramp (from 0 to 320 s, ie, from 0 to 16 V), whereas it increases significantly (slope 2), especially during the steady state, ie, after 320 seconds, for a voltage value at 16 V. In contrast, the thickness of the barrier layer regularly increases (slope 3) both during the transient regime (the voltage ramp) and during the steady‐state voltage regime (Figure ), in agreement with previous works …”
Section: Resultssupporting
confidence: 91%
“…The reanodization slope (m 1 ) thus becomes steeper for films having increasing durations of the first anodization (Figure ). Otherwise, m 1 values seem proportional to the square root of the anodization voltage (Figure ), as proposed previously …”
Section: Resultssupporting
confidence: 79%
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