The auto-measurement of the gap of LCD glass plates using sub-pixel accuracy estimation

Lin, Chern‐Sheng; Cho, Jason; Lay, Yun-Long; Lin, Chan-Shing; Lin, Nanjou

doi:10.1016/j.ijleo.2005.11.006

Cited by 8 publications

(3 citation statements)

References 10 publications

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“…The sub-pixel algorithm is the use of mathematical methods to the basic unit -pixels, which is divided into smaller parts to be able to improve the resolution of the measurement system. [2-3] Räsänen et al application sub-pixel technology to measure the thickness of flat glass [4], Lin et al are using sub-pixel algorithms to improve the correlation like method (CLM) resolution, and applied to measure the distance between the glasses of LCD panel [5] This paper will develop an automated optical inspection(AOI) system instantly detect V groove processing quality, the quality inspection system can instantly put the state back to the manufacturer so that the manufacturer can be tuning the production parameter in accordance with the quality of the finished product, the manufacturing system can achieve a stable manufacturing quality level. In this system, using high-resolution linear encoder as position feedback device, and then with sub-pixel methods to improve the resolution of the system, that does not require laser interferometer can meet the request of V groove measurement.…”

Section: Introductionmentioning

confidence: 99%

Automatic Optical Measurement of High Density Fiber Connector

Chang

Chen

2014

KEM

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This paper will develop an automatic and fast optical measurement system for high density optical fiber connector measurement, which base on the optical project method. It will meet the lot of optical fiber connector measurement need. This system includes a high intensity and high collimated LED source, a high accuracy and high stiffness linear stage, 2 multi-degree-of-freedom adjustment mechanisms and a high resolution coaxial telecentric imaging system and image processing software. The system of measurement results and commercial measuring instruments comparing the results of its error is less than 0.6μm. To measure a V groove needs 750ms, this result may satisfy the requirements of automatic inspection.

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Section: Introductionmentioning

confidence: 99%

Automatic Optical Measurement of High Density Fiber Connector

Chang

Chen

2014

KEM

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“…This research combines digital image processing and electrical tests to send signals to a thin film transistor (TFT) liquid crystal display (LCD) by a signal generator, and then gets an image by a video camera and looks for defects during digital image processing (Lin et al, 2006(Lin et al, , 2005(Lin et al, , 2003. Figure 1 shows the machinery layout and the operationrelated equipment including monitor, keyboard, mouse, and start and stop buttons.…”

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

High‐speed TFT LCD defect‐detection system with genetic algorithm

Lin

Liao

Lay

et al. 2008

Assembly Automation

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Purpose-The purpose of this research is to develop an automatic optical inspection system for thin film transistor (TFT) liquid crystal display (LCD). Design/methodology/approach-A new algorithm that accounts for the closing, opening, etching, dilating, and genetic method is used. It helps to calculate the location and rotation angle for transistor patterns precisely and quickly. The system can adjust inspection platform parameters according to viewed performance. The parameter adaptation occurs in parallel with running the genetic algorithm and imaging processing methods. The proposed method is compared with the algorithms that use artificial parameter sets. Findings-This system ensures high quality in an LCD production line. This multipurpose image-based measurement method uses unsophisticated and economical equipment, and it also detects defects in the micro-fabrication process. Originality/value-The experiment's results show that the proposed method offers advantages over other competing methods.

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Paper No P11: BLU Inspection Machine

Nam¹,

Lee²,

Geum

et al. 2013

Symp Digest of Tech Papers

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In liquid crystal display (LCD), the liquid crystal open and closed light to the color filter as following the circuit. LCD is passive display, so it needs light source. The outer light source is back light unit (BLU). BLU is divided into LED and CCFL based on the characteristics of lighting, but the inspection machine can detect the defects equally in BLU irrespective of LED or CCFL. This paper deals with the invention of inspection machine for BLU. The inspection machine is generally called machine vision. At manufacturing LCD, to detect defects is the one of most important parts. To make the inspection machine for BLU is to make detect machine to defects. There are four types of defects at BLU: the front particles, viewing angle defect (VAD), Mura (faint stain), and scratch. So the inspection machine must to detect four types of defects all. To detect four types of defects, it needed to much research (study) and assembly of many cameras. However, we made the inspection machine using only one camera, it also detects four types of defects. Primarily many cameras are necessary at inspection machine to detect VAD. From the results of more than 200 tests, we came to know that only three angles cameras (front, two pairs) can cover to detect all VAD, and the more, two angles cameras (two pairs cameras) can be replaced by mirror. Hence, the inspection machine using only one camera is invented to detect the defects in BLU. Patent (10‐2009‐0016934) has been applied for the important tech parts for using mirror. The inspection machine for BLU is equipped at most BLU manufacture line, it has been used effectively at manufacturing BLU company.

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The auto-measurement of the gap of LCD glass plates using sub-pixel accuracy estimation

Cited by 8 publications

References 10 publications

Automatic Optical Measurement of High Density Fiber Connector

Automatic Optical Measurement of High Density Fiber Connector

High‐speed TFT LCD defect‐detection system with genetic algorithm

Paper No P11: BLU Inspection Machine

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