2016 International Siberian Conference on Control and Communications (SIBCON) 2016
DOI: 10.1109/sibcon.2016.7491717
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The automated system for parametric characterization of the input and output blocks in digital ICs

Abstract: The article is devoted to an automated system for parameters monitoring of the input and output chains of the logic ICs in order to identify its manufacturer. The system based on National Instruments PXI platform. The hardware and software parts of the system, as well as the measurement process and results threat, are observed.

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