The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation

Xuen, Lim Shi; Khairuddin, Ismail Mohd; Razman, Mohd Azraai Mohd; Jizat, Jessnor Arif Mat; Yuen, Edmund; Jiang, Haochuan; Yap, Eng Hwa; Majeed, Anwar P. P. Abdul

doi:10.1007/978-3-031-26889-2_27

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The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation

Cited by 4 publications

References 10 publications

Surface Anomaly Detection Using Feature-Based Transfer Learning for IoT-Enabled Smart Manufacturing

Surface Anomaly Detection Using Feature-Based Transfer Learning for IoT-Enabled Smart Manufacturing

Feature-Based Transfer Learning for IoT-Enabled Defect Detection for Quality Control in Industrial Manufacturing Processes: A DenseNet Evaluation

A Feature-Based Transfer Learning Method for Surface Defect Detection in Smart Manufacturing

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