The coherence of the gate and drain noise in stressed AlGaAs–InAlGaAs PHEMTs

Low-frequency current noise in electrochromic devices

“…In conclusion, we have shown that the current noise in the investigated EC system is of 1/ f type during discharging, and that its intensity has the potential for monitoring the degradation and aging of these devices. This is not surprising because the 1/ f noise spectrum is a well-known tool for monitoring the reliability of electronic [16][17][18][19] and ionic devices [20] such as batteries [21], sensors, and transducers. 1/ f noise can also provide information on corrosion processes [14,22,23] and enhance gas detection [24].…”

Quality assessments of electrochromic devices: the possible use of 1/f current noise

“…This article will deal with 1/f noise during the discharge of EC devices and with changes of this noise as a consequence of device degradation. The 1/f noise has been used in the past for monitoring the reliability of electronic [9][10][11][12][13] and ionic [14] devices such as batteries [15], sensors, and transducers [16]. Furthermore, 1/f noise can give information on corrosion processes [17][18][19][20] and lead to improved sensitivity in gas detectors [21][22][23].…”