The Colloidal Probe Technique and its Application to Adhesion Force Measurements

Kappl, Michael; Butt, Hans‐Jürgen

doi:10.1002/1521-4117(200207)19:3<129::aid-ppsc129>3.0.co;2-g

Cited by 229 publications

(150 citation statements)

References 73 publications

(88 reference statements)

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“…The introduction of the colloid probe technique [15,16] opened new possibilities to study the interaction between micrometer-sized particles and surfaces as well as interparticle forces and has led to a large diversity of research based on this method [354,592].…”

Section: Particle Adhesionmentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

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3,246

2,949

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Section: Particle Adhesionmentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

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3,246

2,949

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“…We can glue particles to rectangular of triangular tipless cantilever [153]. The diameter range of particles usually is in the range 1µm to 50 µm [153].…”

Section: Colloidal Probe and Tip Radiusmentioning

confidence: 99%

“…Attachment of colloidal particles is usually done by use of a micromanipulator under the control of an optical microscope. Basically, a thin layer of glue (~ 10 -9 mm 3 ) is placed onto the very end of the cantilever and then the cantilever is brought in contact with the top of the micron-size particle [153]. This is accomplished either by keeping the cantilever fixed and using fine wires to move the glue and particles, or to pick up the glue and particle by moving carefully the cantilever.…”

Section: Colloidal Probe and Tip Radiusmentioning

confidence: 99%

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

et al. 2006

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To optimize the handling of fine powders in industrial applications, understanding the interaction forces between single powder particles is fundamental. The forces between colloidal particles dominate the behavior of a great variety of materials, including paints, paper, soil, and many industrial processes. With the invention of the atomic force microscope (AFM), the direct measurement of the interaction between single micron-sized particles became possible. The adhesional contact between a particle and a substrate is a parameter for analyzing pull-off force data generated by AFM. The aim of this study was to understand surface interactions between fine particles. I measured the adhesion forces between AFM tips or particles attached to AFM cantilevers and different solid samples. Smooth and homogeneous surfaces such as silicon wafer, mica, or highly oriented pyrolytic graphite (HOPG), and more rough and heterogeneous surfaces such as iron particles or patterns of TiO 2 nanoparticles on silicon wafer were used. First, I addressed to the wellknown issue that AFM adhesion experiment results show wide distributions of adhesion forces rather than a single value. My experimental results show that variations in adhesion forces comprise fast (i.e., from one force curves to the next) random fluctuations and slower fluctuations, which occur over tens or hundreds of consecutive measurements. Slow fluctuations are not likely to be the result of variations in external factors such as lateral position, temperature, humidity, and so forth because those were kept constant. Even if two solid bodies are brought into contact under precisely the same conditions (same place, load, direction, etc.) the result of such a measurement will often not be the same as for the previous contact. The measurement itself will induce structural changes in the contact region which can change the value for the next adhesion force measurement.In the second part I studied the influence of humidity on the adhesion of nanocontacts. Humidity was adjusted relatively fast to minimize tip wear during one experiment. For hydrophobic surfaces, no signification change of adhesion force with humidity was observed. Adhesion force-versus-humidity curves recorded with hydrophilic surfaces either showed a maximum or continuously increased. I demonstrate that the results can be interpreted with simple continuum theory of the meniscus force. The meniscus force is calculated based on a model that includes surface roughness and takes into account different AFM tip (or particle) shapes by a two-sphere-model.Experimental and theoretical results show that the precise contact geometry has a critical influence on the humidity dependence of the adhesion force.Changes of tip geometry on the sub-10-nm length scale can completely change adhesion force-versus-humidity curves. Our model can also explain the differences between earlier AFM studies, where different dependencies of the adhesion force on humidity were observed.Keywords: Atomic force microscopy (AFM), cantile...

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“…[2][3][4] The most commonly used experimental apparatus for AFM friction measurements consists of a cantilevertip assembly and its force transducers. The tip is typically made of a silicon or silicon nitride apex formed by chemical etching, or a bead of a few micrometers in radius, sometimes called a colloid tip, 5,6 attached to a thin silicon or silicon nitride film cantilever. The transducer is commonly made of a position sensitive photodetector ͑PSPD͒ array, which senses the deflection of a laser beam reflected off the top surface of the AFM cantilever near the end.…”

Section: Introductionmentioning

confidence: 99%

Lateral force calibration of an atomic force microscope with a diamagnetic levitation spring system

Kim

Rydberg

2006

Review of Scientific Instruments

177

127

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A novel diamagnetic lateral force calibrator (D-LFC) has been developed to directly calibrate atomic force microscope (AFM) cantilever-tip or -bead assemblies. This enables an AFM to accurately measure the lateral forces encountered in friction or biomechanical-testing experiments at a small length scale. In the process of development, deformation characteristics of the AFM cantilever assemblies under frictional loading have been analyzed and four essential response variables, i.e., force constants, of the assembly have been identified. Calibration of the lateral force constant and the “crosstalk” lateral force constant, among the four, provides the capability of measuring absolute AFM lateral forces. The D-LFC is composed of four NdFeB magnets and a diamagnetic pyrolytic graphite sheet, which can calibrate the two constants with an accuracy on the order of 0.1%. Preparation of the D-LFC and the data processing required to get the force constants is significantly simpler than any other calibration methods. The most up-to-date calibration technique, known as the “wedge method,” calibrates mainly one of the two constants and, if the crosstalk effect is properly analyzed, is primarily applicable to a sharp tip. In contrast, the D-LFC can calibrate both constants simultaneously for AFM tips or beads with any radius of curvature. These capabilities can extend the applicability of AFM lateral force measurement to studies of anisotropic multiscale friction processes and biomechanical behavior of cells and molecules under combined loading. Details of the D-LFC method as well as a comparison with the wedge method are provided in this article.

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The Colloidal Probe Technique and its Application to Adhesion Force Measurements

Cited by 229 publications

References 73 publications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Force measurements with the atomic force microscope: Technique, interpretation and applications

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

Lateral force calibration of an atomic force microscope with a diamagnetic levitation spring system

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