2020
DOI: 10.1088/1755-1315/596/1/012028
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The Comparison between Samarium Doped Nickel Oxide and Samarium Added Nickel Oxide on Dielectric Properties

Abstract: In this research, the effect of Samarium Oxide (Sm) doped (mol%) NiO as a dopant and added (wt%) in NiO as ceramic composite were investigated. The comparison of both doped and added ceramic in their dielectric properties was studied. Both electroceramic Ni(1-x)SmxO and NiSmO3 were prepared by using a solid-state reaction method. Samarium was added with five different concentrations, which are 0.01, 0.02, 0.03, 0.05, and 0.10 mol% for dopant and another five different concentrations which are 1, 2, 3, 4, and 5… Show more

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Cited by 3 publications
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“…A slight lattice expansion from 4.17671(4) to 4.17743(4) Å is evident with increase of the Sm content from 0 to 0.5%, above which a slight contraction with a value close to ∼4.177 Å occurs. The obtained slight lattice expansion agrees with the previous report; however, we did not see any peak splitting (Figure b) . Contrary to the above observation, a contraction has also been reported from Ni 98 Sm 2 O NPs. , The ionic radius of Sm 3+ (109.8 pm) is much larger than that of Ni 2+ (83 pm), which justifies the obtained lattice expansion and suggests that Sm-doping up to 0.5–1% possibly leads to substitution of Ni 2+ ions with Sm 3+ .…”
Section: Resultssupporting
confidence: 90%
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“…A slight lattice expansion from 4.17671(4) to 4.17743(4) Å is evident with increase of the Sm content from 0 to 0.5%, above which a slight contraction with a value close to ∼4.177 Å occurs. The obtained slight lattice expansion agrees with the previous report; however, we did not see any peak splitting (Figure b) . Contrary to the above observation, a contraction has also been reported from Ni 98 Sm 2 O NPs. , The ionic radius of Sm 3+ (109.8 pm) is much larger than that of Ni 2+ (83 pm), which justifies the obtained lattice expansion and suggests that Sm-doping up to 0.5–1% possibly leads to substitution of Ni 2+ ions with Sm 3+ .…”
Section: Resultssupporting
confidence: 90%
“…The variation in the ⟨ d XRD ⟩ and η concerning Sm content is also supported by the reduced intensity of the PXRD diffractogram and the obtained ⟨ d ⟩ from FE-SEM. The above findings assert that Sm has very low solid solubility (up to 1%) in NiO; its incorporation significantly disturbs the NiO lattice structure and hinders its crystal growth, possibly through surface charge modification. ,, …”
Section: Resultsmentioning
confidence: 81%
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