“…Atomic resolution transmission electron microscope (TEM), with the ability to see single atom, is typically used to give a direct visualization of the cation vacancies. [ 90,95,107 ] Other powerful techniques for detecting cation vacancies in nanomaterials, especially the materials without long‐range order, are extended X‐ray absorption fine structure (EXAFS) [ 77,78,97,105,111 ] and X‐ray pair distribution function (PDF) analysis, [ 89,94,96,106 ] both of which are sensitive to the local structure variations that enable accurate determination of cation vacancies. Additionally, multiple analytical techniques, such as X‐ray photoelectron spectroscopy (XPS), [ 91,105,113 ] nuclear magnetic resonance (NMR), [ 94–96 ] Raman/Fourier transform infrared (FTIR) spectroscopy, [ 104 ] electron paramagnetic resonance (EPR), [ 110 ] photoluminescence (PL), [ 110 ] and positron annihilation spectrometry (PAS), [ 114 ] have also been reported to serve as complementary tools for cation vacancies characterization.…”