2000
DOI: 10.1107/s0021889800004611
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The crystal neutron diffractometer resolution function, spatial effects included

Abstract: A procedure for computing the resolution function for a crystal neutron diffractometer, taking into account the spatial con®guration of the experimental setup and the monochromator curvature, is presented. A brief general description of the matrix computation technique is given. The program DAX, which employs this technique, is presented.

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Cited by 11 publications
(5 citation statements)
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“…Recently, an analytical approximation of instrumental line shapes [20] and matrix computation technique (program DAX [21]) have been published which basically permits an evaluation of the resolution function and intensity properties of neutron diffractometer taking into account a spatial configuration of the experimental set-up and the monochromator curvature and including also a double crystal monochromator For finding the optimum parameters (crystal cut, thickness and bending radius) Monte Carlo simulations should be used [22,23]. However, according to our knowledge, simulation computation techniques have not yet been used for estimation of multiple reflection effects in elastically deformed crystals.…”
Section: Discussionmentioning
confidence: 99%
“…Recently, an analytical approximation of instrumental line shapes [20] and matrix computation technique (program DAX [21]) have been published which basically permits an evaluation of the resolution function and intensity properties of neutron diffractometer taking into account a spatial configuration of the experimental set-up and the monochromator curvature and including also a double crystal monochromator For finding the optimum parameters (crystal cut, thickness and bending radius) Monte Carlo simulations should be used [22,23]. However, according to our knowledge, simulation computation techniques have not yet been used for estimation of multiple reflection effects in elastically deformed crystals.…”
Section: Discussionmentioning
confidence: 99%
“…The sample position given by ( 5) correspond to a certain value of the scattering angle 2 s . The question is: if we keep the same sample position corresponding to a certain scattering angle value, how much is decreased the resolution if we measure the pattern for a certain To find an answer to this important problem, computations were made, using the DAX program [4], for the configuration existing at INR Pitesti and a sample of 2.5 cm width, 3 cm height and .5 cm thickness, for 5 values of the scattering angle, 30 0 , 50 0 , 70 0 , 90 0 and 110 0 , for which the optimum sample orientation angles are 29 0 , 37 0 , 90 0 , 121 0 , 144 0 respectively; were computed the line widths for a range of 20 0 around the above mentioned scattering angle values. The results are given in Figure 2.…”
Section: Figurementioning
confidence: 99%
“…The matrix method [2], has been successfully used for different configurations, for example the TOF diffractometers with pulsed source [3], or with steady state source [4], the three-axis spectrometers [5], or the crystal diffractometers [6]. The matrix procedure is a convenient one and should be preferred if the normal approximation is still valid and a detailed line profile description is not required, otherwise a Monte Carlo procedure should be used.…”
Section: Introductionmentioning
confidence: 99%