1995
DOI: 10.1016/s0167-8922(08)70646-1
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The direct observation of the anti-wear action of ZDDP

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Cited by 8 publications
(3 citation statements)
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“…One particularly daunting aspect of the generally daunting ZnDTP literature is that virtually every weapon in the surface-analysis arsenal has been brought to bear upon the problem, including Auger electron spectroscopy (AES) [28,29], X-ray photoelectron spectroscopy (XPS) [30,31], near-edge X-ray absorption fine structure (NEXAFS, or XANES) [30,[32][33][34][35][36][37][38][39], Fourier transform infrared spectroscopy (FTIR) [40], time-of-flight secondary-ion mass spectroscopy (ToF-SIMS)[41], scanning force microscopy (SFM) [42,43], the surface forces apparatus (SFA) [27,44], transmission electron microscopy (TEM) [39], scanning electron microscopy (SEM) [45], extended X-ray absorption fine structure (EXAFS) [36] and profilometry [45], as well as in situ tribometry methods such as the direct-observation wear machine (DOWM) [46] and ultra-thin film interferometry [47].…”
Section: Analytical Approachesmentioning
confidence: 99%
“…One particularly daunting aspect of the generally daunting ZnDTP literature is that virtually every weapon in the surface-analysis arsenal has been brought to bear upon the problem, including Auger electron spectroscopy (AES) [28,29], X-ray photoelectron spectroscopy (XPS) [30,31], near-edge X-ray absorption fine structure (NEXAFS, or XANES) [30,[32][33][34][35][36][37][38][39], Fourier transform infrared spectroscopy (FTIR) [40], time-of-flight secondary-ion mass spectroscopy (ToF-SIMS)[41], scanning force microscopy (SFM) [42,43], the surface forces apparatus (SFA) [27,44], transmission electron microscopy (TEM) [39], scanning electron microscopy (SEM) [45], extended X-ray absorption fine structure (EXAFS) [36] and profilometry [45], as well as in situ tribometry methods such as the direct-observation wear machine (DOWM) [46] and ultra-thin film interferometry [47].…”
Section: Analytical Approachesmentioning
confidence: 99%
“…One particularly daunting aspect of the generally daunting ZnD TP litera ture is that virtually every weapon in the surface-analysis arsenal has been brought to bear upon the problem, including Auger electron spectroscopy (AES) [28,29], X-ray photoelectron spectroscopy (XPS) [30,31], near-edge X-ray absorption ®ne structure (N EXAF S, or XAN ES) [30, 32±39], F ourier transform infrared (F TIR ) spectroscopy [40], time-ofight secondary-ion mass spectroscopy (ToF -SIM S) [41], scanning force microscopy (SF M ) [42,43], the surface forces apparatus (SF A) [27,44], transmission electron microscopy (TEM ) [39], scanning electron microscopy (SEM ) [45], extended X-ray absorption ®ne structure (EXAF S) [36] and pro®lometry [45], as well as in situ tribometry methods such as the directobservation wear machine (D OWM ) [46] and ultra-thin ®lm interferometry [47].…”
Section: Analytical Approachesmentioning
confidence: 99%
“…A few examples may be cited. Film formation during sliding has been investigated by electrical contact resistance measurement (3), (4) and by direct observation (5). Elemental composition of antiwear films has been reported for both films from bench tests (3) and engine experiments (6).…”
Section: Retiredmentioning
confidence: 99%