2024
DOI: 10.1039/d4cp00825a
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The dopant (n- and p-type)-, band gap-, size- and stress-dependent field electron emission of silicon nanowires

Chandra Kumar,
Vikas Kashyap,
Juan Escrig
et al.

Abstract: This study investigates the electron field emission induced from vertical silicon nanowires (SiNWs) fabricated onto n-type Si(100) and p-type Si(100) substrates using catalyst-induced etching. The impact of dopant (n- and...

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