2016
DOI: 10.1080/09205071.2015.1109005
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The dual polarization method for characterization of dielectric materials

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Cited by 3 publications
(2 citation statements)
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“…Methods for measuring material properties using reflection properties are reported in [ 21 , 22 ]. In this section, the material property estimation method is presented.…”
Section: Methodsmentioning
confidence: 99%
“…Methods for measuring material properties using reflection properties are reported in [ 21 , 22 ]. In this section, the material property estimation method is presented.…”
Section: Methodsmentioning
confidence: 99%
“…Generally, the two independent measurements can be obtained by either altering the incident field or altering the layered sample stack of the material under test (MUT). An example technique which alters the incident field is the dual-polarization technique where the reflection coefficient is measured when the incident field is at parallel polarization and a second time when the incident field is at perpendicular polarization [17]. Methods which alter the sample stack may vary the position of the sample within the stack or the composition of the adjacent layers behind the MUT.…”
Section: Review Of Free Space Reflection-only Extraction Equationsmentioning
confidence: 99%