2023
DOI: 10.1021/acsenergylett.3c02399
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The Effect of Air Ionization in Testing Perovskite-Based Direct Conversion X-ray Detectors

Yuki Haruta,
Paul Huber,
Alexander Hart
et al.
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Cited by 12 publications
(2 citation statements)
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“…In order to exclude the effect of air ionization, we prepared a reference device in which the perovskite membrane under investigation was replaced by an insulator glass and measure the current under the same conditions (Figures f and S6, see more test details in Supporting Information). The average sensitivities were determined to be 6521.6 ± 700 μC Gy air –1 cm –2 after eliminating the interference of air ionization under low dose rates of 1.2–5.9 μGy air s –1 at 25 V (Figures S7 and S8). We also compared the sensitivity values reported so far for biocompatible X-ray detectors based on both rigid and flexible semiconductors including metal-free perovskite single crystals, ,, metal-free perovskite flexible polycrystalline thin films, , organics, , and metal–organic frameworks (MOF) in Figure g.…”
Section: Resultsmentioning
confidence: 99%
“…In order to exclude the effect of air ionization, we prepared a reference device in which the perovskite membrane under investigation was replaced by an insulator glass and measure the current under the same conditions (Figures f and S6, see more test details in Supporting Information). The average sensitivities were determined to be 6521.6 ± 700 μC Gy air –1 cm –2 after eliminating the interference of air ionization under low dose rates of 1.2–5.9 μGy air s –1 at 25 V (Figures S7 and S8). We also compared the sensitivity values reported so far for biocompatible X-ray detectors based on both rigid and flexible semiconductors including metal-free perovskite single crystals, ,, metal-free perovskite flexible polycrystalline thin films, , organics, , and metal–organic frameworks (MOF) in Figure g.…”
Section: Resultsmentioning
confidence: 99%
“…Additionally, thorough testing and accurate characterization of MHPPDs are imperative. 189 Common issues include the overestimation of D * due to the oversight of noise currents other than J d , 190 the challenges in testing MHPPDs for direct X-ray detection under atmospheric conditions, 191 and incorrect application of formulas or linear fitting in assessing the LDR of MHPPDs. 192 Implementing advanced characterization techniques is fundamental to elucidate the chemical, morphological, structural, and optoelectronic attributes of MHPs, which assist in mitigating J d in MHPPDs.…”
Section: Summary and Perspectivesmentioning
confidence: 99%