2009
DOI: 10.1007/s00339-009-5532-4
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The effect of cesium metal clusters on the optical properties of cesium iodide thin films

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Cited by 23 publications
(15 citation statements)
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“…The details of calculation of the extinction coefficient ext within Gans' model have been given by Link et al [21] In the present work, we report the results of theoretical calculations made for the extinction coefficients of cesium metal nanorods in CsCl, CsBr, and CsI matrix using Gans' model. These calculations were then compare with the experimental results reported earlier in [12][13][14]. The factors known to influence the SPR peak position are the size of a metal nanoparticle, its dielectric constant (i), par-ticle shape, and (ii) the surrounding media via its dielectric constant.…”
Section: Introductionmentioning
confidence: 88%
See 1 more Smart Citation
“…The details of calculation of the extinction coefficient ext within Gans' model have been given by Link et al [21] In the present work, we report the results of theoretical calculations made for the extinction coefficients of cesium metal nanorods in CsCl, CsBr, and CsI matrix using Gans' model. These calculations were then compare with the experimental results reported earlier in [12][13][14]. The factors known to influence the SPR peak position are the size of a metal nanoparticle, its dielectric constant (i), par-ticle shape, and (ii) the surrounding media via its dielectric constant.…”
Section: Introductionmentioning
confidence: 88%
“…The recent report on the natural ageing process has again brought the spotlight on AH [11]. It was observed that -centers/ 2 centers or defects are formed due to the halide atoms moving out of their lattice positions under the heat treatment [12][13][14], which leads to the clustering of Cs atoms. This causes the strong absorption in the UV-visible spectral region.…”
Section: Introductionmentioning
confidence: 99%
“…As the film thickness is further increased, we may believe that this strain is communicated through the whole film and as a result, presence of compressive stress continue to increase with the film thickness. In a recent work of K. Kumar et al [31], they have observed tensile stress for "as-deposited" CsI films with thicknesses 580 nm -730 nm. However they also observed a compressive stress below 580 nm CsI films which is in agreement with our findings.…”
Section: Structural Properties Of Csi Thin Filmsmentioning
confidence: 98%
“…由于光子吸收以及二次电子传输等性质与 CsI 薄膜厚度直接相关, 对光阴极厚度的理论设计与 实验研究受到了人们广泛关注。对于透射式 CsI 光 阴极而言, QE 对厚度变化敏感。 Valentini 等 [26] 的计 算结果表明, 对于波长为 170 nm 的光子, 10 nm 厚 度的 CsI 薄膜具有最大的 QE, 当厚度为 60 nm 时 QE 已经非常低。Lu [27] 和 Boutboul [28] 等认为用于 160~190 nm 波段 CsI 光阴极的最优厚度为 10~20 nm, 但在实验中发现 20 nm 厚的 CsI 薄膜暴露在空气 中仅几分钟就发生了破裂。我们课题组建立了软 X 光能区(0.1~10 keV)CsI 二次电子产出与膜厚及 入射角的关系, 并采用同步辐射光源测试了透射 式光阴极谱响应灵敏度, 结果表明最优厚度约为 60 nm [29][30][31] 。对于反射式 CsI 薄膜光阴极, QE 在膜 厚为几十 nm 时达到最大值 [32][33] , 并且在一定范围 内, 厚度增加对 QE 的影响不大, 大于 500 nm 的膜厚 会使电场作用减弱导致 QE 下降 [17] 。Braem 等 [32] [7] 、色心 [34] 、位错 [23] 、颗粒内部和边界 中的水分子以及颗粒界面 [35] 等都可能使电子在传输 中损失能量; 薄膜表面的吸附水 [13] 、O 2 [36] 、C 元素及 化合物 [6,9,11,37] 以及 Cs、I 元素比例的变化和相应化 合物的生成 [14] 都可能造成电子亲和势增大, 阻碍电 子向真空发射。 目前, 人们对 CsI 薄膜中缺陷及表面污染产生 的原因及影响 QE 的原理还存在不同的看法。薄膜 在生长过程中可能会受到镀膜系统中残余水分子、 碳氢化合物以及挥发 I 元素的污染 [12,23,38] , 并可能 产生色心及 Cs 析出 [38][39] 。 受潮和辐照引起的缺陷等 将在第 2 节中具体讨论。…”
Section: 膜厚unclassified
“…Xie 等 [6] 认为这可能是 QE 下降的原因之一。 图 3 (a)刚制备、(b)在空气中暴露后、(c)在极端潮湿环境中 暴露后 CsI 薄膜的 SEM 照片 [49] ; (d)NIF 采用的 X 射线条纹相 机上 200 nm 厚的 CsI 透射式光阴极信号下降与空气暴露时间 的关系 [47] Fig. 3 SEM images of as-deposited (a), aged in ambient air (b) and extreme moisture exposed CsI films (c) [49] ; Percent degradation in the yield signal of streak camera used at NIF from a 200 nm thick CsI cathode as a function of air exposure time [47] Kumar 等 [39,51] 的实验结果表明 Cs 的含量仅在部分 微区域偏高, 他们认为 Cs 含量在真空热蒸发一开 始就出现增加, 原因为 I 的升华和色心聚集与析出。 一些研究者认为受潮导致的薄膜形貌及颗粒尺寸的 变化对 QE 也有影响 [2,11,18,35] , 其中 Nitti 等 [18] 认为这 是 QE 下降的重要原因。 几乎所有对 CsI 薄膜光阴极受潮的研究都发现薄 膜中颗粒尺寸变大, 但对颗粒生长的动力学过程有不 同的描述: Xie 等 [6] 认为, 薄膜中较小颗粒在颗粒顶端 岛状水溶液重力、静电引力及表面张力作用下发生合 并形成大颗粒; Triloki [50] 和 Boutboul [28] 等认为颗粒长大 源于薄膜表面溶液相中水分挥发所引起的再结晶;…”
Section: 老化研究unclassified