The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities

Cao, Yue; Sheyfer, Dina; Jiang, Zhang; Maddali, Siddharth; You, Hoydoo; Wang, Bixia; Ye, Zuo‐Guang; Đufresne, Eric M.; Zhou, Hua; Stephenson, G. B.; Hruszkewycz, S. O.

doi:10.3390/cryst10121109

Cited by 4 publications

(2 citation statements)

References 35 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…SASE fluctuations of energy, intensity and coherence, but even more pointing, wavelength and beam size may lead to decorrelation as every pulse probes a different sample spot under different beam conditions [157,158].…”

mentioning

confidence: 99%

From Femtoseconds to Hours—Measuring Dynamics over 18 Orders of Magnitude with Coherent X-rays

2021

View full text Add to dashboard Cite

X-ray photon correlation spectroscopy (XPCS) enables the study of sample dynamics between micrometer and atomic length scales. As a coherent scattering technique, it benefits from the increased brilliance of the next-generation synchrotron radiation and Free-Electron Laser (FEL) sources. In this article, we will introduce the XPCS concepts and review the latest developments of XPCS with special attention on the extension of accessible time scales to sub-μs and the application of XPCS at FELs. Furthermore, we will discuss future opportunities of XPCS and the related technique X-ray speckle visibility spectroscopy (XSVS) at new X-ray sources. Due to its particular signal-to-noise ratio, the time scales accessible by XPCS scale with the square of the coherent flux, allowing to dramatically extend its applications. This will soon enable studies over more than 18 orders of magnitude in time by XPCS and XSVS.

show abstract

mentioning

confidence: 99%

From Femtoseconds to Hours—Measuring Dynamics over 18 Orders of Magnitude with Coherent X-rays

2021

View full text Add to dashboard Cite

show abstract

“…The lack of available tools to observe and model fluctuations in XFEL wavefield statistics has been identified as a limiting factor across a broad range of coherent X-ray imaging applications (Nagaya et al, 2016;Reddy et al, 2017;Nakano et al, 2018;Cao et al, 2020). The interpretation of experimental outcomes in these applications requires an understanding of the sensitivity of key experimental parameters to shot-to-shot fluctuations in the irradiating wavefield (Dallari et al, 2021).…”

Section: Introductionmentioning

confidence: 99%

A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser

Guest,

Bean,

Kammering

et al. 2023

Int Union Crystallogr J

View full text Add to dashboard Cite

Many coherent imaging applications that utilize ultrafast X-ray free-electron laser (XFEL) radiation pulses are highly sensitive to fluctuations in the shot-to-shot statistical properties of the source. Understanding and modelling these fluctuations are key to successful experiment planning and necessary to maximize the potential of XFEL facilities. Current models of XFEL radiation and their shot-to-shot statistics are based on theoretical descriptions of the source and are limited in their ability to capture the shot-to-shot intensity fluctuations observed experimentally. The lack of accurate temporal statistics in simulations that utilize these models is a significant barrier to optimizing and interpreting data from XFEL coherent diffraction experiments. Presented here is a phenomenological model of XFEL radiation that is capable of capturing the shot-to-shot statistics observed experimentally using a simple time-dependent approximation of the pulse wavefront. The model is applied to reproduce non-stationary shot-to-shot intensity fluctuations observed at the European XFEL, whilst accurately representing the single-shot properties predicted by FEL theory. Compared with previous models, this approach provides a simple, robust and computationally inexpensive method of generating statistical representations of XFEL radiation.

show abstract

In situ coherent x-ray scattering reveals polycrystalline structure and discrete annealing events in strongly coupled nanocrystal superlattices

Hurley,

Tanner,

Portner

et al. 2024

Phys. Rev. Research

View full text Add to dashboard Cite

Solution-phase bottom up self-assembly of nanocrystals into superstructures such as ordered superlattices is an attractive strategy to generate functional materials of increasing complexity, including very recent advances that incorporate strong interparticle electronic coupling. While the self-assembly kinetics in these systems have been elucidated and related to the product characteristics, the weak interparticle bonding interactions suggest the superstructures formed could continue to order within the solution long after the primary nucleation and growth have occurred, even though the mechanism of annealing remains to be elucidated. Here, we use a combination of Bragg coherent diffractive imaging and x-ray photon correlation spectroscopy to create real-space maps of supercrystalline order along with a real-time view of the strain fluctuations in aging strongly coupled nanocrystal superlattices while they remain suspended and immobilized in solution. By combining the results, we deduce that the self-assembled superstructures are polycrystalline, initially comprising multiple nucleation sites, and that shear avalanches at grain boundaries continue to increase crystallinity long after growth has substantially slowed. This multimodal approach should be generalizable to characterize a breadth of materials in their native chemical environments, thus extending the reach of high-resolution coherent x-ray characterization to the benefit of a much wider range of physical systems. Published by the American Physical Society 2024

show abstract

The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities

Cited by 4 publications

References 35 publications

From Femtoseconds to Hours—Measuring Dynamics over 18 Orders of Magnitude with Coherent X-rays

From Femtoseconds to Hours—Measuring Dynamics over 18 Orders of Magnitude with Coherent X-rays

A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser

In situ coherent x-ray scattering reveals polycrystalline structure and discrete annealing events in strongly coupled nanocrystal superlattices

Contact Info

Product

Resources

About