The effect of layer interface on recrystallization behavior of layered aluminum: An in-situ EBSD study

Abstract

In recent years, layered heterogeneous metallic materials have received considerable attention. In this work, we fabricated an AA3003/AA1060 layered aluminum and introduced heterogeneity by regulating recrystallization behavior via accumulative roll bonding and annealing processes. The annealing process was studied by in-situ electron backscatter diffraction (EBSD) observation. The present work shows that the recrystallization rate in the AA1060 layer is significantly higher than that in the AA3003 layer. This disparity can be attributed to the varying element composition, which generates a layered aluminum structure comprising alternating fine-grained and coarse-grained layers. Moreover, the influence of layer interface on the recrystallization behavior of the AA1060 layer was investigated. The result shows that high energy storage near the interface promotes recrystallization nucleation and grain growth. This study reveals the formation mechanism of layered heterogeneous metallic materials, which can help the design and preparation of high-performance heterogeneous metallic materials.