2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena 2013
DOI: 10.1109/ceidp.2013.6747070
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The effect of material interfaces on electrical tree growth and breakdown time of epoxy resin

Abstract: The effect of interface modification on electrical tree growth and breakdown of epoxy resin Abstract -This study investigates the effect of an interface on the lifetime of epoxy resin samples and the growth characteristics of electrical trees. Six sample types are presented; all having been prepared in the point-plane configuration using a needle -with a tip radius of 3μm-as the HV electrode. Most were molded in two parts producing an interface perpendicular to the field direction at the centre of the sample. … Show more

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Cited by 3 publications
(3 citation statements)
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“…In results shown in previous publications [1]- [3], the positive impact of interfaces perpendicular to the electric field is evident: increasing the samples' time to breakdown as well as increasing electrical tree inception time. Further investigation has been focused on modifying the interface and how this might be used to control the electrical tree growth as well as the samples' time to breakdown.…”
Section: Introductionmentioning
confidence: 66%
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“…In results shown in previous publications [1]- [3], the positive impact of interfaces perpendicular to the electric field is evident: increasing the samples' time to breakdown as well as increasing electrical tree inception time. Further investigation has been focused on modifying the interface and how this might be used to control the electrical tree growth as well as the samples' time to breakdown.…”
Section: Introductionmentioning
confidence: 66%
“…Steel Ogura™ needles with a tip radius of 3 um and diameter of 1 mm were used as the HV electrode. This needle was chosen in favor of the hypodermic needle used in the previous results presented (CEIDP'13) [1] since it is a needle widely used in the literature [4]- [6] and it also eliminates the silicon coating removal procedures needed to be followed with the previous electrode [7] thus minimizing the effect of any silicon residue on the results.…”
Section: Materials Usedmentioning
confidence: 99%
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