2004
DOI: 10.1016/j.microrel.2003.08.012
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The effect of model building on the accuracy of fatigue life predictions in electronic packages

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Cited by 20 publications
(10 citation statements)
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“…Area array components have evolved as a viable solution to meet the requirements of these devices. As packaging density is increasing, solder joint reliability has become a critical issue in the electronic packaging industry [1,2]. A large body of research has recently been conducted in relation to the reliability issues and properties of fine solder joints [3][4][5].…”
Section: Introductionmentioning
confidence: 99%
“…Area array components have evolved as a viable solution to meet the requirements of these devices. As packaging density is increasing, solder joint reliability has become a critical issue in the electronic packaging industry [1,2]. A large body of research has recently been conducted in relation to the reliability issues and properties of fine solder joints [3][4][5].…”
Section: Introductionmentioning
confidence: 99%
“…In the present study, we used the refined finite element models of Towashiraporn et al (2004b) to analyze fracture propagation and life prediction using the earlier described hybrid model. Since the power cycling test condition involves complex, transient, anisothermal condition, transient heat transfer analysis using temperature-dependent convective heat transfer coefficients was carried out.…”
Section: Finite Element Analysis Of Accelerated Cycling Testsmentioning
confidence: 99%
“…The resulting nodal temperature solutions were then exported in temporal and spatial domains to the subsequent elastic-plastic-creep analysis. The details of the empirical life modeling including an extensive study of sources and effects of error in finite element analysis and the values of material properties are described by Towashiraporn et al (2004b).…”
Section: Finite Element Analysis Of Accelerated Cycling Testsmentioning
confidence: 99%
“…With the power of the computer capacity increasing, it is now possible to integrate more accurate definitions in finite element model such as material characterization, refined mesh and effects on the surrounding to evaluate the reliability [1]. This can also be said of power semiconductor modules where their reliability becomes a main focus on current research.…”
Section: Introductionmentioning
confidence: 99%