1999
DOI: 10.1109/23.819121
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The effect of near-interface network strain on proton trapping in SiO/sub 2/

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Cited by 23 publications
(25 citation statements)
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“…50 These quantum mechanical studies performed on molecules and small clusters provide a foundation for the existence of protonated bridging oxygens ͑BOs͒ at the interface between silica and water. Thus, certain bridges at the silica-water interface should serve as adsorption sites for excess protons, and these sites may contribute to the anomalously high proton conductivity observed in wet nanoporous silica glasses.…”
Section: Introductionmentioning
confidence: 99%
“…50 These quantum mechanical studies performed on molecules and small clusters provide a foundation for the existence of protonated bridging oxygens ͑BOs͒ at the interface between silica and water. Thus, certain bridges at the silica-water interface should serve as adsorption sites for excess protons, and these sites may contribute to the anomalously high proton conductivity observed in wet nanoporous silica glasses.…”
Section: Introductionmentioning
confidence: 99%
“…Consequentially, protons rapidly diffuse along these defect tracks into the subsurface by hopping between adjacent defects [21,24,25], and these excess subsurface protons will readily passivate neighboring NBOs formed by subsequent collision cascades. The net result is the inhibition of structural healing in the subsurface caused by H + ; despite the fact that H 2 O molecules were not able to diffuse down these defect tracks, their presence at the surface still caused increased damage accumulation away from the interface.…”
Section: Discussionmentioning
confidence: 99%
“…4; rather, they are the result of excess protons diffusing through the silica network from the near-surface reaction region (minor formation of H 2 O from O in the silica occurs and will be discussed below). The excess H + on SiOH þ 2 and BOH sites are acidic and highly mobile [22][23][24][25]37], and this mobility facilitates the increase in both subsurface H + concentration and penetration depth.…”
Section: Effect Of Radiation Damage On Subsurface H + Concentrationsmentioning
confidence: 98%
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“…These were likely formed during the reaction of water with the surface Si atoms forming a silanol and an H + , which penetrated several layers within the crystal and attached to a bridging oxygen. Protonated bridging oxygens in a vitreous silica and water system have been observed in MD 18 and molecular orbital 19,20 calculations and have been previously discussed. 18 Furthermore, a small layer of water molecules is attached to the Si on the quartz surface (SiÀO distance <1.9 Å).…”
Section: ' Introductionmentioning
confidence: 90%