In this study, we investigate the structural and chemical changes occurring on the surface of cadmium sulfide (CdS) when subjected to bombardment with oxygen ions (O+). CdS is a semiconductor material with variousapplications in optoelectronic devices, and understanding its surface modifications under ion bombardment is crucial for improving its performance. Using a combination of analytical techniques, including X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), and energy-dispersive X-ray spectroscopy (EDS), we explore the alterations induced by O+ ion bombardment. Our findings reveal significant changes in the surface composition and morphology of CdS, shedding light on potential applications in semiconductor technology.