Infrared imaging systems are being updated towards greater performance as well as lighter and smaller equipment. Developing infrared materials with special properties is a critical part of enhancing the performance of optical systems as well as miniaturising devices. Chalcogenide glass becomes a popular choice for advanced IR materials due to its component-property tunability. Se-based glasses such as Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub>, Ge<sub>10</sub>As<sub>40</sub>Se<sub>50</sub>, and As<sub>40</sub>Se<sub>60</sub>, which completely cover the mid- and long-wave infrared windows, are the most typical materials used in infrared equipment applications. However, these classical materials can no longer meet the requirements of high-performance imaging systems, and adding more elements such as Te, Ga, Sb, Ag, etc., to enhance the performance is a reliable way to solve this problem. By analysing the structure and properties of the Ge<sub>20</sub>Se<sub>80-x</sub>Te<sub>x</sub> glass system, the law of Te on the evolution of the structure and properties of this glass system is illustrated. Typical results such as, with the increase of Te content, the glass transition temperature (T<sub>g</sub>) increases and then decreases influenced by the network structure and the average bond energy; the density and refractive index increase in an approximately linear gradient; the Abbe number gradually increases; while the Vickers hardness hardly changes with the change of Te content; and the fracture toughness decreases with the increase of Te content. Aiming at the problem that the average coordination number is unable to evaluate the glass systems composed of two or more elements from the same main group, a theoretical bandgap-glass property evaluation system has been successfully established. The functional relationships between parameters such as density, refractive index, Abbe number, fracture toughness, etc. and theoretical band gap have been established for Ge<sub>20</sub>Se<sub>80-x</sub>Te<sub>x</sub> glass system as shown in the summary figure, which can be used for rapid evaluation of glass components and properties.