The effect of thermal aging process on dielectric response of bushings with RBP and RIP insulation

Subocz, J.; Mrozik, A.; Bohatyrewicz, Patryk

doi:10.1109/imitel.2018.8370484

Cited by 1 publication

(6 citation statements)

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“…Advanced insulation aging in the form of visible discoloration was observed in the layers located close to the conduction, and compounds of carbon insulation degradation were detected. Figure 5 shows the effects of thermal aging on the SVM measurement results for the RBP insulated type CRPT 52 kV bushing [16]. After 10 years of operation, the absorption coefficient value was Ka = 1.37 (Figure 5a), which suggests a good overall condition without advanced aging processes.…”

Section: Test Subject and Research Methodologymentioning

confidence: 98%

“…In terms of medium (MF) and low (LF) frequencies, the changes of tgδ and the capacity values were typical for thermosetting composites at an early stage of the thermal degradation, which is Figure 10. The effect of temperature on K a values for PTK 52 kV bushing [16].…”

Section: Fds Analysis Of Bushings Insulationmentioning

confidence: 99%

“…The SVM test chart of CRPT 52 kV bushing insulation after (a) 10 years of operation; (b) an additional 340 h of aging after deinstallation; (c) an additional 740 h of aging after deinstallation[16].…”

mentioning

confidence: 99%

“…The analysis of the CTF 245 kV (serial number 75D76) bushing: (a) SVM test chart; (b) cross-section of the core[16].…”

mentioning

confidence: 99%

“…The SVM test results of CTF 245 kV bushings after 25 years of operation: (a) serial number 73D56979; (b) serial number 73D56980; (c) serial number 73D56981[16].…”

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confidence: 99%

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Condition Assessment of HV Bushings with Solid Insulation based on the SVM and the FDS Methods

et al. 2020

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This paper presents the dielectric response of the insulation of bushings as an effect of the simulated long-term aging process. The experiment was conducted under a condition of a high temperature difference between the current circuit and the cover. The dielectric response was measured with the FDS (Frequency Dielectric Spectroscopy) and the SVM (Step Voltage Measurement) methods. The research has shown the correlation between the aging time and some parameters obtained with the FDS and SVM analysis.

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Section: Test Subject and Research Methodologymentioning

confidence: 98%

Section: Fds Analysis Of Bushings Insulationmentioning

confidence: 99%

mentioning

confidence: 99%

“…The analysis of the CTF 245 kV (serial number 75D76) bushing: (a) SVM test chart; (b) cross-section of the core[16].…”

mentioning

confidence: 99%

“…The SVM test results of CTF 245 kV bushings after 25 years of operation: (a) serial number 73D56979; (b) serial number 73D56980; (c) serial number 73D56981[16].…”

mentioning

confidence: 99%

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