The effect of three‐fold astigmatism on measurements of grain boundary volume expansion by high‐resolution transmission electron microscopy

Merkle, K. L.; Csencsits, R.; Rynes, K. L.; Withrow, James; Stadelmann, PA

doi:10.1046/j.1365-2818.1998.2890841.x

Cited by 28 publications

(19 citation statements)

References 16 publications

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“…So only a relative measurement is possible with internal reference. The non-corrected threefold astigmatism can introduce shifts in the lattice fringe pattern leading to substantial errors (5 pm) on the measured values of volume expansions, for example in grain boundaries [133].…”

Section: Discussionmentioning

confidence: 99%

Extracting Quantitative Information from High Resolution Electron Microscopy

Kret

Ruterana

Rosenauer

et al. 2001

phys. stat. sol. (b)

120

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Despite the development of high-resolution electron microscopy (HREM) that allows imaging of most materials, the extraction of quantitative information at atomic scale still requires considerable additional efforts. This review presents the recent developments on techniques that can be used to determine the local strain, chemical composition or atomic structure retrieval in HREM. The source of noise in images and effective methods for improving the signal-to-noise ratio in direct or Fourier space are discussed. The artefacts of filtering are commented. In all the methods, the sample thickness has to be determined. A detailed analysis of the thin foil relaxation effect on the measured distortion fields is presented as well as the possibilities of using finite element calculations for its modelling. The local composition measurement based on the chemically sensitive reflections; pattern recognition and the measurement of lattice parameters are described. Examples from semiconductor heterostructures are discussed. The current state of the strategies used for the retrieval of the atomic configuration of defects from HRTEM images is briefly presented. The limits of detection and the accuracy of the methods are summarised; and it is pointed out that electron holography, focal series reconstruction and the coming Cs corrected microscopes will help to obtain this information with better accuracy. Content

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Section: Discussionmentioning

confidence: 99%

Extracting Quantitative Information from High Resolution Electron Microscopy

Kret

Ruterana

Rosenauer

et al. 2001

phys. stat. sol. (b)

120

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“…In phase-contrast imaging, image aberrations, such as twofold or threefold astigmatism or crystal tilt can provide substantial errors in RBT measurements unless taken specifically into account in image simulations. 31,32 In serially acquired high-resolution images, such as the Z-contrast images, errors can be introduced by mechanical or scan instabilities or drift. Within the experimental error, however, no in-plane rigid-body translations are observed, and the correlation coefficient between the structural unit and its mirror image is 0.86.…”

Section: (1) ⌺5 (310) Grain Boundarymentioning

confidence: 99%

Structure and Chemistry of Yttria‐Stabilized Cubic‐Zirconia Symmetric Tilt Grain Boundaries

Dickey

Fan

Pennycook

2001

Journal of the American Ceramic Society

100

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The atomic structures of two symmetric [001] tilt grain boundaries in yttria-stabilized cubic-zirconia, ⌺5 (310) and near-⌺13 (510), are studied by Z-contrast scanning transmission electron microscopy. Both boundaries are composed of periodic arrays of highly symmetric structural units, with a distinct unit for each boundary. Oxygen K-edge electron energy-loss spectra show that the oxygen coordination is similar between the bulk and grain boundary, indicating that oxygen ions within the grain boundary reside in distorted tetrahedral sites. Atomic models of the grain boundaries are proposed that are consistent with the experimental data. The core structures are different from previously studied metal or oxide grain boundaries and are unique to the fluorite structure. Yttrium segregation to the grain boundaries is also investigated by electron energy-loss spectroscopy. Yttrium is found to segregate preferentially to the ⌺5 grain boundary, and the spatial distribution of the segregation layer is confined to within 1 nm of the boundary plane.

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“…For example, dynamic scattering will certainly modify the apparent position of lattice planes at the boundary plane but from symmetry arguments the net effect should not produce overall contractions and expansions. Three-fold astigmatism can produce artificial rigid-body displacements at grain boundaries [22], but only for non-common lattice planes, in our case in the y-direction, not for the common {111} lattice planes perpendicular to the boundary.…”

Section: Analysis and Discussionmentioning

confidence: 76%

Stress and strain around grain-boundary dislocations measured by high-resolution electron microscopy

Hÿtch

Putaux

Thibault

2006

Philosophical Magazine

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International audienceStresses and strains around a dislocation at a grain boundary in germanium are measured by a combination of high-resolution electron microscopy and geometric phase analysis. The method is established by first measuring the strains around a matrix dislocation in silicon. Stresses are determined using linear elastic theory and bulk elastic constants. Strain measurements are shown to agree with theoretical calculations based on linear anisotropic elastic theory to 0.2% at a spatial resolution of 2-3 nm. A dislocation constricted at a coherent twin boundary in germanium is subsequently analysed. The method is adapted to cope with the problem that the reference lattice is not identical for the whole field of view, due to the grain boundary. Strains are compared with theoretical calculations of a matrix dislocation in germanium. Whilst strains in the grains on either side of the twin boundary agree closely with the isolated dislocation case, significant additional strains are localised at the boundary plane. By comparing the stresses and strains across the boundary plane, values for the elastic modulus of the twin boundary are proposed. The significant reduction in elastic modulus for the boundary, when compared to bulk elastic constants, is interpreted in terms of the non-equilibrium configuration of the boundary. An extension of the method is proposed to measure more generally the elastic properties of grain boundaries and interfaces

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The effect of three‐fold astigmatism on measurements of grain boundary volume expansion by high‐resolution transmission electron microscopy

Cited by 28 publications

References 16 publications

Extracting Quantitative Information from High Resolution Electron Microscopy

Extracting Quantitative Information from High Resolution Electron Microscopy

Structure and Chemistry of Yttria‐Stabilized Cubic‐Zirconia Symmetric Tilt Grain Boundaries

Stress and strain around grain-boundary dislocations measured by high-resolution electron microscopy

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