2023
DOI: 10.1088/1402-4896/ad07ba
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The effects of illumination on the current conduction mechanisms of the Au/C20H12/n-Si Schottky barrier diode (SBD)

Seda Bengi

Abstract: Using the I-V characteristics both in the dark and under varied illumination-intensities (50–250 mW.cm−2) by 50 mW.cm−2 steps in the wide range bias-voltage (±5 V), specific fundamental electrical and photo effects parameters of the Au/C20H12/n-Si SBD were examined. Due to the creation of electron–hole pairs and their drift in opposite directions under the influence of an electric field, the value of photocurrent in the reverse bias (Iph) increases when illumination density is increased. The barrier height (ΦB… Show more

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Cited by 2 publications
(3 citation statements)
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“…Consequently, an increase in P in indicates a larger V OC , which can be attributed to a greater number of charge carriers near the device junction, or to their blockage near the junction. Furthermore, when P in increases, so does R SH , which is important for carrier accumulation at the interface [31]. The total η of OSC increases with increased light intensity as illustrated in figures 7(c) & (d).…”
Section: Combine the Effect Of Interlayer Contact And Lif Interface O...mentioning
confidence: 88%
See 1 more Smart Citation
“…Consequently, an increase in P in indicates a larger V OC , which can be attributed to a greater number of charge carriers near the device junction, or to their blockage near the junction. Furthermore, when P in increases, so does R SH , which is important for carrier accumulation at the interface [31]. The total η of OSC increases with increased light intensity as illustrated in figures 7(c) & (d).…”
Section: Combine the Effect Of Interlayer Contact And Lif Interface O...mentioning
confidence: 88%
“…If the leakage current has a higher value than the dark current, it has a substantial effect on the light current and causes sharp drops in V OC and J SC . Although the difference between the photocurrent and leakage current is primarily the light current, at lower light levels, the leakage current approaches its peak [31]. This paper will now present a model for the effects of absorber thickness, charge carrier mobility ratios, trap-state densities, blend P 3 HT with four different fullerene derivatives, interlayer contact, light intensities, and T on OSC device performance characteristics.…”
Section: Introductionmentioning
confidence: 99%
“…When the light hits on the photodiode, the new photogenerated extra free charge carriers (electron-hole pairs) occurred in the device pass over the barrier height. The drift of these carriers in opposite directions under the influence of an electric field either can increase the current (photocurrent) in the reverse region (thus the ideality factor increases and barrier height decreases) [55,56] or can decrease the reverse current (thus decreases the ideality factor and increases the barrier height) [57] depending on the illumination, localized states, recombination types and the device [58].…”
Section: Characteristics Of Cualv/n-si/al Nems Photodiodementioning
confidence: 99%