2009
DOI: 10.1149/1.3122137
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The Effects of Oxidants on the Growth Behavior of PbTiO3 Thin Film by Atomic Layer Deposition

Abstract: PbTiO 3 thin films were deposited on Si and Ru substrates by atomic layer deposition (ALD) at a substrate temperature of 200 o C using H 2 O and O 3 as oxidants. When H 2 O was used as the oxidant for both Pb-and Ti-precursors, film growth was most effective under the PbO vs. TiO 2 growth cycle ratio where stoichiometry (Pb/Ti concentration ratio = 1) of the film could be achieved. The previously reported catalytic effect observed in the PbTiO 3 ALD process was attributed to the enhanced growth of the componen… Show more

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Cited by 3 publications
(2 citation statements)
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“…First of all, the effect of the oxygen source used to deposit a layer of titania for the subsequent growth of a layer of PbO x was considered. This study was already published elsewhere . It shows that (i) a PbO x layer enhances the growth of the TiO 2 layer, and vice versa (this has been attributed to a catalytic effect, such as those already observed in a multioxide ALD component ,, ), (ii) the growth of PbO x on TiO 2 is enhanced when H 2 O was used as an oxygen source for the Ti precursor compared with O 3 , and (iii) the Pb/Ti ratio increases more quickly when O 3 is used to grow the TiO 2 layer.…”
Section: Resultssupporting
confidence: 62%
See 1 more Smart Citation
“…First of all, the effect of the oxygen source used to deposit a layer of titania for the subsequent growth of a layer of PbO x was considered. This study was already published elsewhere . It shows that (i) a PbO x layer enhances the growth of the TiO 2 layer, and vice versa (this has been attributed to a catalytic effect, such as those already observed in a multioxide ALD component ,, ), (ii) the growth of PbO x on TiO 2 is enhanced when H 2 O was used as an oxygen source for the Ti precursor compared with O 3 , and (iii) the Pb/Ti ratio increases more quickly when O 3 is used to grow the TiO 2 layer.…”
Section: Resultssupporting
confidence: 62%
“…The samples were loaded into the ALD chamber again for subsequent PbO x growth. Furthermore, prior to the ALD of PbO x using O 3 , rather thick ( n cy = 400) PbO x films were deposited on the substrates using H 2 O to protect the substrates from being damaged . Figure a,b shows the changes in the Pb LD of the PbO x films grown on Si and Ru substrates using H 2 O and O 3 as oxygen sources, respectively, as a function of n cy .…”
Section: Resultsmentioning
confidence: 99%