Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference - 1993 (Cat. No.93CH3283-9)
DOI: 10.1109/pvsc.1993.347131
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The effects of sweep rate, voltage bias and light soaking on the measurement of CIS-based solar cell characteristics

Abstract: Recent work by several groups has shown that the efficiency of CuInSe, (CIS) devices often increases after light soaking. We have found that the voltage sweep rate may also have a large effect on the measured fill factor. This complicates the accurate measurement of the performance of CulnSe, and other I-III-V12 solar cells. Devices would have to be pre-light soaked and tested only under constant illumination with a slow voltage ramp rate to most closely simulate a module in operation.

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Cited by 30 publications
(12 citation statements)
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“…A minimum outdoor exposure (at open circuit) of two hours at 1/3 sun or more (even under overcast skies) prior to the pulsed simulator measurement was adopted. Forward voltage biasing to Voc immediately before the measurement was found to be necessary to minimize short-term transients [24]. The difference between the outdoor and such indoor measurements was found to be small, particularly for more stable devices.…”
Section: Measurementsmentioning
confidence: 99%
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“…A minimum outdoor exposure (at open circuit) of two hours at 1/3 sun or more (even under overcast skies) prior to the pulsed simulator measurement was adopted. Forward voltage biasing to Voc immediately before the measurement was found to be necessary to minimize short-term transients [24]. The difference between the outdoor and such indoor measurements was found to be small, particularly for more stable devices.…”
Section: Measurementsmentioning
confidence: 99%
“…These procedures assume that the IV properties of the devices behave like crystalline silicon. CIS, however, has the additional complication that the measurement of the IV curve is sensitive to the recent history of the module [24]. The measurement is sensitive to factors that are less important for crystalline silicon (putting aside LID effects):…”
Section: Measurementsmentioning
confidence: 99%
“…For samples that exhibit transient behavior [13,16,17] it is important to control the pre-measurement conditions. To minimize transient and metastable effects the Cell and Module Performance team at NREL exposes a CdTe or Cu(Ga,In)(S,Se) cells to light for 5 to 10 minutes loaded with a resistor near the maximum power point, P max , and then let the sample cool down for a few minutes to 25 °C and then measure the I-V sweeping from forward to reverse bias.…”
Section: Transients and Metastable Behaviormentioning
confidence: 99%
“…These mini-modules exhibit fogging around the outside edge that did not disappear with outdoor exposure. This data set was chosen as an introduction to this section since the data set illustrates the major results to date for accelerated testing, and the dependence of accelerated testing on transient effects (23,24,25,26,27,28). SSI fabricated CIS-based modules typically pass the TC and HF accelerated environmental tests when an outdoor exposure is incorporated in the test sequence.…”
Section: Accelerated Testing -Including Transient Effects and Processmentioning
confidence: 99%