The Effectі of the Giant and Anisotropic Magnetoresistance: Demonstration and Learning in the Physics Course of High Schools

Лобода, В. Б.; Shkurdoda, Yu. O.; Dovzhyk, М. Ya.; Kravchenko, V. O.; Khursenko, S. M.

doi:10.21272/jnep.10(3).03016

Cited by 2 publications

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“…Further, the signal is amplified in amplifiers ( 3) and ( 5) and enters the multichannel pulse analyzer (6). Information is extracted from it using special computer software (7) and presented in the form of a spectrum of dependence of the number of pulses (X-ray intensity) on the energy of X-ray photons. Methods of X-ray spectral analysis using EDS can determine the concentration of almost any element from beryllium to californium in the concentration range up to tenths of an atomic percent.…”

Section: Fig 2 -Scheme Of the Spectrometer With Edsmentioning

confidence: 99%

“…Along with studies of films of pure magnetic metals (Ni, Co, Fe) and Cu, it is promising to study films of metal alloys [1][2][3][4][5] and film multilayer structures [6][7][8] which include these metals. Alloy films (as well as bulk alloys) have a number of advantages over pure metal films: by changing the composition of the alloy, materials with other electrophysical, physicochemical, and operational properties can be obtained.…”

Section: Introductionmentioning

confidence: 99%

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X-Ray Spectral Microanalysis of Copper-Nickel Thin Films Alloys

Loboda,

Zubko,

Khursenko

et al. 2023

J. Nano- Electron. Phys.

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The article presents the results of studying the elemental composition of films of CuNi alloys by X-ray microanalysis (an X-ray microanalyzer based on an energy-dispersive spectrometer, which is part of the REM-103-01 scanning electron microscope). Alloy films 30-150 nm thick were obtained by simultaneous separate evaporation of the components (copper and nickel) in a vacuum of 10 -4 Pa. Copper was evaporated from a tungsten foil ribbon 0.05 mm thick. Nickel was evaporated by the electron beam method using an electron diode gun. The condensation rate was 0.5-1.5 nm/s. The purity of the evaporated metals was no less than 99.98 %. The calculated composition of the concentrations of the sample components varied over a wide range. The characteristic X-ray spectrum of the film substance was excited by scanning a section of the film with dimensions of 300  300 μm with an electron beam; for thicker films, the size of the scanning area was 1  1 μm. Thin Ni films of the same thickness were used as standards for quantitative measurements of the elemental composition of alloy films of a certain thickness. The results of X-ray microanalysis indicate a high purity of the films. Comparison of the calculated concentrations of alloys and the results of measurements by X-ray microanalysis showed that in the region of film thicknesses d  100 nm, the discrepancy is about 10 %, decreasing to 1 -3 % for sample thicknesses d  100 nm.

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Section: Fig 2 -Scheme Of the Spectrometer With Edsmentioning

confidence: 99%