The electrical properties of CdTe films of different preparation conditions in correlation with microstructure changes

Ashour, A.; El-Kadry, N.; Ebid, M.R.; Farghal, Mostafa; Ramadan, A. A.

doi:10.1016/0040-6090(95)08141-0

Cited by 13 publications

(4 citation statements)

References 19 publications

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“…A review of dependence of above structural parameters on the substrate temperature indicates that the degree of preferred orientation along with the other microstructural features are more effective than the crystallite size for low thickness films. This type of correlation is suggested recently by other workers (Ashor et al 1996;El-Kadry et al 1996) in II-VI thin films.…”

Section: Resultssupporting

confidence: 80%

Structural characterization of vacuum evaporated ZnSe thin films

2000

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Thermally evaporated ZnSe thin films deposited on glass substrates within substrate temperatures (T s ) at 303 K-623 K are of polycrystalline nature having f.c.c. zincblende structure. The most preferential orientation is along [111] direction for all deposited films together with other abundant planes [220] and [311]. The lattice parameter, grain size, average internal stress, microstrain, dislocation density and degree of preferred orientation in the film are calculated and correlated with T s .

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Section: Resultssupporting

confidence: 80%

Structural characterization of vacuum evaporated ZnSe thin films

2000

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“…The annealing effect on structural parameters indicates that the degrees of preferred orientation along with the other microstructural features are more effective than the crystallite size. This type of correlation by other workers [22,23] for II-VI group compound thin films are in good agreement with our results for Bi 2 Te 3 film. The structural parameters calculated in the present work were consolidated in Table 1.…”

Section: Article In Presssupporting

confidence: 95%

Optical properties of thermally evaporated Bi2Te3 thin films

Dheepa¹,

Ramakrishnan²,

Subbarayan³

2005

Journal of Crystal Growth

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“…A close analysis of the dependence of the above microstructural parameters on the substrate temperature indicates that the degree of preferred orientation along with the other microstructural features are more prominent than the crystallite size for films with low thickness. This type of correlation is observed and reported by earlier workers [18,23] for other II-VI thin films like CdSe as well.…”

Section: Methodssupporting

confidence: 63%