2004
DOI: 10.1016/j.ijsolstr.2004.02.048
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The electrical/thermal conductance of rough surfaces––the Weierstrass–Archard multiscale model

Abstract: Rough surfaces show a load-dependent electrical constriction resistance. Here, using a recent analogy due to Barber [Proc. R. Soc. London A 459 (2003) 53] between the incremental stiffness and the conductance in the elastic regime, and the Archard hypothesis to solve the multiscale contact problem, the conductance is found for the profile defined by the Weierstrass series. The analysis is also approximately valid, neglecting thermal effects on the contact area, for the thermal conductance.

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Cited by 38 publications
(36 citation statements)
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“…The first term, known as electrical constriction resistance (ECR), is due to the roughness of the contacting surfaces since the electrical current has to flow through the geometric constriction. The second term, known as film resistance, is attributed to poorly conductive films or oxides formed at the contacts' interface [5]. In this work this latter term is almost removed by applying a previous chemical cleaning of the interface so that the main term of the contact resistance is the constriction resistance.…”
Section: Introductionmentioning
confidence: 99%
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“…The first term, known as electrical constriction resistance (ECR), is due to the roughness of the contacting surfaces since the electrical current has to flow through the geometric constriction. The second term, known as film resistance, is attributed to poorly conductive films or oxides formed at the contacts' interface [5]. In this work this latter term is almost removed by applying a previous chemical cleaning of the interface so that the main term of the contact resistance is the constriction resistance.…”
Section: Introductionmentioning
confidence: 99%
“…Early studies were pioneered by Holm [7] and Greenwood [8], who proposed analytical formulas to calculate the ECR due to round shaped clusters [5]. Different approaches to model the contact resistance of rough surfaces are found in the technical literature, including statistical, multiscale and fractal models [9].…”
Section: Introductionmentioning
confidence: 99%
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