2005
DOI: 10.1140/epjd/e2005-00069-9
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The electron affinities of O, Si, and S revisited with the photodetachment microscope

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Cited by 136 publications
(121 citation statements)
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“…The recorded circular intensity fringes compare very well with the theoretical prediction [22]. They show a highly accurate verification of Einstein's law which can be used to obtain the binding energy of O − with unprecedented accuracy [19,20]. Other new phenomena also appear in these experiments.…”
Section: Near-threshold Effectssupporting
confidence: 74%
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“…The recorded circular intensity fringes compare very well with the theoretical prediction [22]. They show a highly accurate verification of Einstein's law which can be used to obtain the binding energy of O − with unprecedented accuracy [19,20]. Other new phenomena also appear in these experiments.…”
Section: Near-threshold Effectssupporting
confidence: 74%
“…The fringe pattern in the current distribution depends sensitively on the energy. By counting the number of fringes the binding energy E 0 of the outer electron can be determined from Einstein's law [18,19,20,14].…”
Section: Photoelectric Effect As a Two-step Processmentioning
confidence: 99%
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“…For these experiments, the energy scale is calibrated by the S -photoelectron spectrum. 50,51 In contrast with the hemispherical analyzer, the VMI spectrometer has a spectral resolution that is a function of eKE, namely the resolution decreases with increasing eKE. This resolution is determined by the eKE and the Full Width at Half Maximum (FWHM) of a peak in a photoelectron spectrum due to a single transition.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…By ionizing close to the thresholds with pulsed lasers and exploiting resonance-enhanced multiphoton excitation sequences to avoid spectral congestion, rotationally resolved spectra can be observed under conditions where the photoelectron angular distributions are measurable (Allendorf et al 1989, Hockett et al 2009). Interferometric measurements of the photoelectron kinetic energy by photodetachment microscopy fully exploits the advantage of ionizing immediately above threshold and can be used to determine photodetachment thresholds and electron affinities with an accuracy of ≈ 0.005 cm −1 (see Blondel et al 2005).…”
Section: Discussionmentioning
confidence: 99%