2011
DOI: 10.1016/j.tsf.2011.01.368
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The electronic structure of Cu(In1−xGax)Se2 alloyed with silver

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Cited by 81 publications
(73 citation statements)
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“…There are several possibilities for this difference between ACTS and CTS. First, adding a new element, in this case silver, may add an interface defect; this was also found for the ACIGS/CdS interface [21]. Second, KCN etching has been shown to affect the surface band gap, leading to changes in recombination [38].…”
Section: Devicesmentioning
confidence: 91%
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“…There are several possibilities for this difference between ACTS and CTS. First, adding a new element, in this case silver, may add an interface defect; this was also found for the ACIGS/CdS interface [21]. Second, KCN etching has been shown to affect the surface band gap, leading to changes in recombination [38].…”
Section: Devicesmentioning
confidence: 91%
“…Another possible reason for the reduced V oc could be changes at the CdS/ACTS interface. For ACIGS, it was found earlier that the defect concentration is increased at the CIGS/CdS interface, which could be reduced by light soaking (LS) [21]. To check whether the diode of our ACTS cells shows the same trend under LS as for ACIGS/CdS, dark curves were measured before and after 1 h of LS.…”
Section: Devicesmentioning
confidence: 99%
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“…Ag incorporation was also reduced the structure disorder in the absorber since the melting points of Ag-chalcopyrites are ~200 ºC lower than their Cu analogues [19][20][21]. In the CZTS system, Ag 2 ZnSnS 4 and (Ag,Cu) 2 ZnSnS 4 (ACZTS) have shown much better photocatalysts activity for H 2 evolution than CZTS [22,23].…”
Section: Introductionmentioning
confidence: 99%
“…Lower melting temperature than its counterpart Cu(In,Ga)Se 2 (CIGS) may produce (Ag,Cu)(In,Ga)Se 2 (ACIGS) absorbers with lower defect densities [2] and provide a potential pathway to absorber materials for wide-bandgap solar cells with high performance. Three-stage coevaporation [3] has been adopted for wide-bandgap ACIGS deposition and has achieved higher open-circuit voltage (V oc ) while maintaining reasonable short-circuit current (J sc ) and fill factor (FF) [4], [5].…”
Section: Introductionmentioning
confidence: 99%