2011
DOI: 10.1016/j.tsf.2011.04.049
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The erosion behaviors of Y2O3 and YF3 coatings under fluorocarbon plasma

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Cited by 77 publications
(52 citation statements)
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“…Hence, the YF 3 coating is more favorable for application in plasma processing equipment. Similar results were consistent with the previously reported data by Kim et al [18]. …”
Section: Resultssupporting
confidence: 94%
“…Hence, the YF 3 coating is more favorable for application in plasma processing equipment. Similar results were consistent with the previously reported data by Kim et al [18]. …”
Section: Resultssupporting
confidence: 94%
“…The proportional relationship was explained by the fact that those oxides generate highly volatile byproducts after the chemical reaction with fluorine plasma, and that result was also supported by Thienot et al [25]. Therefore, it is a very interesting result that SAY glass showed the lowest plasma etching depth among the glasses because Y generates the most volatile byproduct after the chemical reaction with fluorine plasma among the rare-earth elements in the glasses (Table 4) [21,22]. Physical and chemical etching occurs simultaneously during the plasma etching process [21,26,27].…”
Section: Discussionmentioning
confidence: 70%
“…It seems that the plasma etching test under various biases should be conducted to sufficiently understand the plasma etching behavior of the glass in the future. The degree of fluorination of each element in the glasses after the fluorine plasma exposure [21,22]. …”
Section: Resultsmentioning
confidence: 99%
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“…he plasma processing apparatus for the semiconductor industry uses many ceramics as plasma-facing materials. [1][2][3][4][5][6][7][8] The plasma consists of reactive radicals and ions from fluorocarbon gases, which react with the ceramics and cause erosion. [6][7][8][9] Al 2 O 3 is a typical plasma resistant material and Y 2 O 3 is increasingly being used because of its superior plasma etching resistance.…”
Section: Introductionmentioning
confidence: 99%