The evaluation of surface topography changes in nanoscaled 2,6‐diphenyl anthracene thin films by atomic force microscopy

Abstract

The physical properties of electronic devices made by 2,6-diphenyl anthracene (DPA) are influenced by the microtexture of DPA surfaces. This work focused on the experimental investigation of the 3-D surface microtexture of DPA thin films deposited on OTS (octadecyltrichlorosilane), HMDS (Hexamethyldisilasane), OTMS (octadecyltrimethoxysilane), and Si/SiO 2 (300 nm SiO 2 thickness) substrates with 5 and 50 nm thicknesses and 5 and 10 μm scan size. The thin film surfaces were recorded using atomic force microscopy (AFM) and their images were stereometrically analyzed to obtain statistical parameters, in accordance with ASME B46.1-2009 and ISO 25178-2: 2012. The results showed the effect of different manufacturing parameters on microtexture values where the granular structure is confirmed in all films. In addition, root mean square is increased by increasing the thickness from 5 to 50 nm for all types of substrates.

The effect of applied electric field on the micromorphology of Pt nanoparticles synthesized by laser ablation

“…As an important parameter, a deeper insight into the 3D surface microtexture of the samples have been taken into consideration in advanced studies by improved technological applications (Garczyk, Stach, Ţălu, Sobola, & Wróbel, 2017; Nezafat et al, 2019; Sobola et al, 2020; Tălu, Achour, et al, 2020). According to the high scientific interests about characterization techniques, stereometric analysis has been applied to reveal the 3D surface microtexture (Ţălu, Solaymani, Rezaee, & Nezafat, 2021) and fractal/multifractal analyses (Tălu, Kulesza, et al, 2020) by a series of surface parameters. Specific patterns in 3D images of atomic force microscopy (AFM) along with image processing techniques extract useful information about nanoscaled complex surfaces (Stach et al, 2015).…”

Study on the Tribological Behavior of Wear and Friction Coefficient on AISI M35 High-Speed Steel with and without DLC Coating

“…In the contact analysis mode, an Olympus silicon AC160TS probe scanned areas of 25 µm 2 , 100 μm 2 and 400 µm 2 , with an average resonance frequency of 300 kHz and an average spring constant of 26 N/m. The scanning mode of the probe was of the intermittent constant oscillatory type (Tapping) 32 , characterized by large amplitude vibrations and the signal is predominantly influenced by repulsive short-range interactions. Through the senility of the sensor in capturing the deflections of the probe during scanning over surfaces, two-dimensional and three-dimensional topographic images are recorded in the equipment's own software, making it possible to quantify the surfaces by means of the arithmetic mean roughness parameter (R a ) at scale nano-metric 33 .…”