2006
DOI: 10.1016/j.sna.2005.12.036
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The evaluation of Young's modulus and residual stress of copper films by microbridge testing

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Cited by 18 publications
(14 citation statements)
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“…Regarding the mechanical properties, the Young’s modulus of the crystalline silicon is above 100 GPa, which is gradually decreased to 25 GPa along with increased lithiation to Li 3.75 Si . Compared to silicon, the Young’s modulus of copper is more than 120 GPa, which is comparable to the Young’s modulus of silicon. It indicates that copper is suitable as a buffer medium in the Si/C electrode.…”
Section: Introductionmentioning
confidence: 94%
“…Regarding the mechanical properties, the Young’s modulus of the crystalline silicon is above 100 GPa, which is gradually decreased to 25 GPa along with increased lithiation to Li 3.75 Si . Compared to silicon, the Young’s modulus of copper is more than 120 GPa, which is comparable to the Young’s modulus of silicon. It indicates that copper is suitable as a buffer medium in the Si/C electrode.…”
Section: Introductionmentioning
confidence: 94%
“…Micro-bridge structure driven by electrostatic force is familiar in MEMS devices, such as changeable capacitors, RF switches, micro-resonators, pressure sensors, and so on. On one hand, it is a common structure being used to obtain the mechanical parameters of film, just like Young's Modulus, residual stress, yield strength and bending strength [3][4][5]. But on the other hand, MEMS devices with micro-bridge structure are often with low reliability and worse quality, which is induced by pull-in phenomena.…”
Section: Introductionmentioning
confidence: 99%
“…For 0.53 and 2.5‐µm solid Cu films fabricated at 0° e‐beam incidence the in‐plane modulus was derived from experimental wrinkle data as 119 ± 3 and 120 ± 3 GPa, respectively, which is in agreement with literature reports for solid Cu films and provides validation of the accuracy of the experimental procedure used in this study. [ 47,51 ] For solid Cu films deposited on PDMS at 20° e‐beam incidence, Specimens #5 and #6 in Table 3, the measured wrinkle wavelength was λ = 47.1 ± 1 µm and λ = 235.1 ± 3 µm for 0.5 and 2.5‐µm thick films, respectively (Figure 3c). Consistently for both 0.5 and 2.5‐µm thick films the extracted in‐plane compressive modulus averaged 94 ± 6 GPa.…”
Section: Resultsmentioning
confidence: 99%