The Extraction of Dielectric Constant by Using the Metal Insulator Metal Capacitor for the Substrate Material

Abstract

they can make reliable measurements to extremely high frequencies.The primary disadvantage is that they provide data in the frequency In this paper, the substrate is extracted the material domain. Subsequently, it is necessary to translate the extracted data characterization for several capacitor patterns. We design some pads into a useful format that can be used in the time domain [1]. and vias by measuring. The substrate material can be extracted unknown dielectric properties. Then, the new packaging have been designed and completed, it is verified the electrical performance by using EM simulator and save cycle time.