2004
DOI: 10.1016/j.jcrysgro.2003.08.033
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The growth mechanism of GaN grown by hydride vapor phase epitaxy in N2 and H2 carrier gas

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Cited by 28 publications
(26 citation statements)
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“…Reactor pressures, disk rotation speeds, and temperatures typical of III-V semiconductor growth conditions were used [21][22][23], and temperature was varied to study its effects on ZnO etching. Reactor pressure was held at 500 Torr and disk rotation speed was held at 1500 rpm while flow rates of 23 and 20 l/min were used for H 2 and N 2 , respectively.…”
Section: Methodsmentioning
confidence: 99%
“…Reactor pressures, disk rotation speeds, and temperatures typical of III-V semiconductor growth conditions were used [21][22][23], and temperature was varied to study its effects on ZnO etching. Reactor pressure was held at 500 Torr and disk rotation speed was held at 1500 rpm while flow rates of 23 and 20 l/min were used for H 2 and N 2 , respectively.…”
Section: Methodsmentioning
confidence: 99%
“…As a start, the parameters during HVPE growth-like reactor design, carrier gasses and precursors are very important in obtaining good quality layers [7][8][9][10][11][12]. However, after these aspects have been optimized still many things can be varied.…”
Section: Introductionmentioning
confidence: 99%
“…The distance between nearest islands is 50 µm. The conditions for HVPE growth have been described in previous paper [9].…”
Section: Methodsmentioning
confidence: 99%