The growth of carbon films with random atomic structure from ion impact damage in a hydrocarbon plasma

Holland, L.; Ojha, S.M.

doi:10.1016/0040-6090(79)90219-0

Cited by 174 publications

(24 citation statements)

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“…The films are characterized by a hardness measured to be 3000-9000 kg/mm^ [10] and a generally low friction coefficient, between 0.01 [11] and 0.28 [12], but also very high internal stresses [4,7,11,13]. They typically have high optical transparency over a wide spectral range [14], high electrical resistivity, and chemical inertness to both acids and alkalis.…”

Section: Introductionmentioning

confidence: 99%

Diamondlike carbon films by rf plasma-assisted chemical vapor deposition from acetylene

1990

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This paper is an overview of studies performed at the IBM Thomas J. Watson Research Center on diamondlilte carbon (hydrogenated amorphous carbon) films, including some recent results on their tribological properties. The films were prepared by rf plasma-assisted chemical vapor deposition (PACVD) from acetylene. Their structure and composition were characterized by a variety of methods such as X-ray and TEM diffractometry, XPS, high-resolution ^^C NMR spectroscopy, and H(^^Na,7)C nuclear-reaction profiling. Their adhesion to various substrates, coefficients of static and dynamic friction, and wear resistance were also characterized. It was ^Copyright 1990 by International Business Macliines Corporation. Copying in printed form for private use is permitted without payment of royalty provided that (1) each reproduction is done without alteration and (2) the Journal reference and IBM copyright notice are included on the first page. The title and abstract, but no other portions, of this paper may be copied or distributed royalty free without further permission by computer-based and other information-service systems. Permission to republish any other portion of this paper must be obtained from the Editor.found that the films were essentially amorphous, reaching their bulk composition after 40 nm of growth above the initial growth interface. Their bulk composition included about 40% hydrogen. More diamondlike carbon bonding was obtained at the initial growth interface than in the bulk range. The ratio of sp^ to sp^ carbon atoms was found to be 1.6, with virtually all sp^ carbon atoms bound to one or more hydrogen atoms. The diamondlike carbon films (DLC) displayed excellent adhesion to the surface of Si. Furthermore, the films could be bonded to films of otherwise nonbonding metals, provided the metals formed stable silicides. By using an interfacial Si film several atomic layers thick, adhesion to the metal films could be improved to the extent that attempts to detach the DLC films fractured the underlying metal films. The adhesive DLC films were found to have a very high resistance to sliding wear and chemical attack, and are therefore useful in various applications as very thin protective coatings. 849

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Section: Introductionmentioning

confidence: 99%

Diamondlike carbon films by rf plasma-assisted chemical vapor deposition from acetylene

1990

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“…Analysis over the other 17 observations in the combined n-diamond [5] and i-carbon [1] datasets, shows that the DFT optimized glitter model fits these 17 observations with an average percentage deviation (%d) of 1.41% (98.59% agreement between the model and the n-diamond and i-carbon experimental dataset). It is believed that the uncertainties associated with recording electron diffraction data from carbon nanocrystals, in the work on n-diamond [5] and i-carbon [1] described here, is within a 2% uncertainty, and we believe here that the glitter model [10] is thus a reasonable explanation for the numerous observations of kinetically stabilized C forms reported in the literature as n-diamond and i-carbon [1][2][3][4][5][6][7][8].…”

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confidence: 92%

“…Two nanometer-sized and crystalline forms of C that are particularly prominent in these studies are the so-called n-diamond and i-carbon forms [1][2][3][4][5][6][7][8]. Figure 1 below, thus shows a high resolution electron micrograph (HREM) of a representative nanocrystalline C droplet of n-diamond synthesized by such shock methods, where the indexation of the lattice image is to a diamond model [1][2][3][4][5][6][7][8]. In previous work by us [9], we have shown that the commonly observed diffraction patterns of these carbon nanocrystals recorded by several research groups around the world, are consistent with the calculated diffraction pattern of a novel form of carbon we have proposed called glitter.…”

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confidence: 99%

On the n-diamond and i-carbon nanocrystalline forms

Bucknum

Castro

2011

J Math Chem

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We report on a comparison of the diffraction pattern observed for nanocrystalline n-diamond and i-carbon forms by other investigative teams, with the calculated diffraction pattern of glitter based upon lattice parameters optimized using the DFT-CASTEP method. The close fit of the latter dataset to that observed for ndiamond and i-carbon, as reported herein, suggests that indeed i-carbon may be of the same structure as n-diamond, and that they both may have the tetragonal glitter structure.Keywords Nanocrystalline n-diamond · i-Carbon · DFT-CASTEP method · Tetragonal glitter structure In the carbon science literature, there have been various reports over the previous few decades of potentially novel crystalline forms of carbon emerging as kinetically stabilized, nanometer scale fragments recovered from the explosive remnants of heated, shock compressed graphite and other precursors of C by rapid cooling. Two nanometer-sized and crystalline forms of C that are particularly prominent in these studies are the so-called n-diamond and i-carbon forms [1][2][3][4][5][6][7][8]. Figure 1 below, thus shows a high resolution electron micrograph (HREM) of a representative nanocrystalline C droplet of n-diamond synthesized by such shock methods, where the indexation of the lattice image is to a diamond model [1][2][3][4][5][6][7][8].

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“…[1][2][3][4][5][6][7][8] parameters of glitter, ultrasoft pseudopotentials were employed, the basis set had an energy cutoff of 400 eV and k-point sampling was done with a 10x10x4 mesh.…”

Section: As Shown Inmentioning

confidence: 99%