Abstract:A high aluminum (Al) content β-(AlxGa1−x)2O3 film was synthesized on c-plane sapphire substrate using the gallium (Ga) diffusion method. The obtained β-(AlxGa1−x)2O3 film had an average thickness of 750 nm and a surface roughness of 2.10 nm. Secondary ion mass spectrometry results indicated the homogenous distribution of Al components in the film. The Al compositions in the β-(AlxGa1−x)2O3 film, as estimated by X-ray diffraction, were close to those estimated by X-ray photoelectron spectroscopy, at ~62% and ~6… Show more
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