In this letter the authors present a comprehensive study of the threshold current and its temperature dependence in GaAsSb-based quantum well edge-emitting lasers for emission at 1.3 m. It is found that at room temperature, the threshold current is dominated by nonradiative recombination accounting for more than 90% of the total threshold current density. From high hydrostatic pressure dependence measurements, a strong increase in threshold current with pressure is observed, suggesting that the nonradiative recombination process may be attributed to electron overflow into the GaAs/ GaAsP barrier layers and, to a lesser extent, to Auger recombination. © 2006 American Institute of Physics. ͓DOI: 10.1063/1.2369649͔Lasers emitting close to 1.3 m are of considerable importance for the development of metro-area networks.
1Progress in this area has been hindered largely by the need to significantly reduce the cost of the laser module itself. The incumbent InGaAsP quantum well ͑QW͒ material system used to make such lasers suffers from two problems: Firstly, the fact that they are grown on InP makes it difficult to produce vertical cavity surface emitting lasers ͑VCSELs͒ which are vastly more cost effective but are better suited to GaAs substrates. Secondly, the devices are highly susceptible to temperature variations resulting in the need to incorporate sophisticated temperature control electronics into the package, leading to an order of magnitude increase in cost. Hence, there has been considerable effort devoted to the development of GaAs-based laser active regions which emit at 1.3 m. InAs quantum dots 2 and GaInNAs-based QWs have been the subject of extensive research. However, the properties of even the best quantum dot lasers are far from ideal, since their threshold current density increases quickly with temperature around room temperature due to nonradiative recombination resulting in a low characteristic temperature, T 0 ϳ 50 K ͓T 0 = ͑d ln I th / dT͒ −1 ͔, similar to that of standard 1.3 m QW based lasers.3 P-doped quantum dot lasers can exhibit very high T 0 values ͑even infinite over a narrow temperature range͒, but this is achieved at the expense of higher threshold currents compared with undoped devices.4 For GaInNAs-based QW lasers, it has been shown that even for the best 1.3 m devices available, approximately 50% of the threshold current at room temperature may be attributed to defect-related recombination. 5 The implications of this on long-term device stability have yet to be fully addressed. Another possibility is the use of GaAsSb/ GaAs QWs.6 Lasers based upon this material have been produced, 7 but little, if any, research has been undertaken to assess the carrier recombination and temperature dependent processes occurring in such devices. The aim of this letter is to consider the characteristics of GaAsSb/ GaAs-based edge-emitting lasers and to explore the potential of GaAsSb/ GaAs active regions for use in 1.3 m VCSELs.The devices in this study consist of a triple GaAs 0.9 P 0.1 / GaAs/ GaAs 0.7...