The Importance of Distributed Loading and Cantilever Angle in Piezo-Force Microscopy

Huey, Bryan D.; Ramanujan, Chandra S.; Bobji, M. S.; Blendell, John E.; White, Grady S.; Szoszkiewicz, Robert; Kulik, Andrzej

doi:10.1007/s10832-004-5114-y

Cited by 53 publications

(48 citation statements)

References 7 publications

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“…These non-piezoelectric effects not only hinder accurate PFM measurements but also, in some cases, cumulatively dominate the measured 7 PFM response. [73][74][75] It is therefore very important to acknowledge and understand their influence to allow an accurate interpretation of material properties measured by PFM.…”

Section: Principle Of Pfmmentioning

confidence: 99%

Non-piezoelectric effects in piezoresponse force microscopy

Seol¹,

Kim²,

Kim³

2017

Current Applied Physics

135

114

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Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantilever dynamics of an atomic force microscopy. However, several non-piezoelectric effects can induce additional contributions to the EM response, which often lead to a misinterpretation of the measured PFM response. This review aims to summarize the non-piezoelectric origins of the EM response that impair the interpretation of PFM measurements. We primarily discuss two major non-piezoelectric origins, namely, the electrostatic effect and electrochemical strain. Several approaches for differentiating the ferroelectric contribution from the EM response are also discussed. The review suggests a fundamental guideline for the proper utilization of the PFM technique, as well as for achieving a reasonable interpretation of observed PFM responses.

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Section: Principle Of Pfmmentioning

confidence: 99%

Non-piezoelectric effects in piezoresponse force microscopy

Seol¹,

Kim²,

Kim³

2017

Current Applied Physics

135

114

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“…However, the lack of control on mechanical fields results in mostly incomplete information with respect to the separation of the ferroelectric and ferroelastic interfaces, unless complicated threedimensional reconstruction of the domain structure is exploited. [22,23] Therefore, it is imperative to create an approach for local studies of strain-induced phenomena, where external pressure exerted by an SPM probe will directly affect ferroelastic properties of the material during ferroelectric switching.…”

Section: Introductionmentioning

confidence: 99%

Local Probing of Ferroelectric and Ferroelastic Switching through Stress‐Mediated Piezoelectric Spectroscopy

Edwards

Brewer

Cao

et al. 2016

Adv Materials Inter

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Strain effects have a significant role in mediating classic ferroelectric behavior such as polarization switching and domain wall dynamics. These effects are of critical relevance if the ferroelectric order parameter is coupled to strain and is therefore, also ferroelastic. Here, switching spectroscopy piezoresponse force microscopy (SS‐PFM) is combined with control of applied tip pressure to exert direct control over the ferroelastic and ferroelectric switching events, a modality otherwise unattainable in traditional PFM. As a proof of concept, stress‐mediated SS‐PFM is applied toward the study of polarization switching events in a lead zirconate titanate thin film, with a composition near the morphotropic phase boundary with co‐existing rhombohedral and tetragonal phases. Under increasing applied pressure, shape modification of local hysteresis loops is observed, consistent with a reduction in the ferroelastic domain variants under increased pressure. These experimental results are further validated by phase field simulations. The technique can be expanded to explore more complex electromechanical responses under applied local pressure, such as probing ferroelectric and ferroelastic piezoelectric nonlinearity as a function of applied pressure, and electro‐chemo‐mechanical response through electrochemical strain microscopy.

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“…It was recognized that electrostatic tip-surface forces and buckling oscillations of the cantilever can provide significant and in some cases even dominating contributions to the PFM signal. 17,18,19 Imaging ferroelectric materials in the vicinity of a phase transition at small probing biases or imaging of biological systems with weak electromechanical coupling require optimal imaging conditions to be established, and a number of approaches based on using contact resonances in PFM have been suggested. 20,21 Finally, it is recognized that the use of the cantilever coupled with a beam-deflection detection system typical for most commercial AFM s does not allow longitudinal and normal force components to be unambiguously distinguished, 12,22 and it has been suggested that operation at specific frequencies would allow these components to be differentiated.…”

Section: Introductionmentioning

confidence: 99%

Dynamic behaviour in piezoresponse force microscopy

Jesse

Baddorf

Kalinin³

2006

Nanotechnology

113

114

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Frequency dependent dynamic behavior in Piezoresponse Force M icroscopy (PFM ) implemented on a beam-deflection atomic force microscope (AFM ) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises contributions from local electrostatic forces acting on the tip, distributed forces acting on the cantilever, and three components of the electromechanical response vector. These interactions result in the bending and torsion of the cantilever, detected as vertical and lateral PFM signals.The relative magnitudes of these contributions depend on geometric parameters of the system, the stiffness and frictional forces of tip-surface junction, and operation frequencies. The dynamic signal formation mechanism in PFM is analyzed and conditions for optimal PFM imaging are formulated. The experimental approach for probing cantilever dynamics using frequency-bias spectroscopy and deconvolution of electromechanical and electrostatic contrast is implemented. * Corresponding author, sergei2@ornl.gov 2

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The Importance of Distributed Loading and Cantilever Angle in Piezo-Force Microscopy

Cited by 53 publications

References 7 publications

Non-piezoelectric effects in piezoresponse force microscopy

Non-piezoelectric effects in piezoresponse force microscopy

Local Probing of Ferroelectric and Ferroelastic Switching through Stress‐Mediated Piezoelectric Spectroscopy

Dynamic behaviour in piezoresponse force microscopy

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