The INEL X-Ray Position Sensitive Detector: A Study of D-Spacing Accuracy and Exposure Time

Deniard, Philippe; Evain, Michel; Barbet, Jean-Michel; Brec, R.

doi:10.4028/www.scientific.net/msf.79-82.363

Cited by 27 publications

(19 citation statements)

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“…A cubic spline correction of the angular linearity based upon simple pattern reference compounds such as silicon or quartz is insufficient by far. Indeed, previous studies (Deniard, Evain, Barbet & Brec, 1991) have pointed out that those corrections lead to large positive correlations (62o for a given compound is minimum around the standard reflection 20 values but maximum in between those values). This observation suggested a need for a new standard with a large number (> 50) of nonoverlapping intense peaks over the entire 120 ° 20 range.…”

Section: Linearandatandnmentioning

confidence: 99%

“…Nevertheless, some problems inherent to the detector architecture (such as its linearity) and to the Debye-Scherrer geometry (such as absorption) needed to be thoroughly tackled. A first preliminary investigation of the d-spacing accuracy and the exposure time has already been reported (Deniard, Evain, Barbet & Brec, 1991). The aim of the present work is to complete those studies and to extend them to the question of intensity accuracy.…”

Section: Introductionmentioning

confidence: 99%

“…The powder patterns were processed with the laboratory designed PROLIX program (Deniard, Evain, Barbet & Brec, 1991) specially written to deal with the INEL CPS120 curved-detector data. Besides the usual features (background removal, peak hunting, profile fitting etc.…”

Section: Data Processingmentioning

confidence: 99%

See 2 more Smart Citations

Potential of the INEL X-ray position-sensitive detector: a general study of the Debye–Scherrer setting

Evain¹,

Deniard²,

Jouanneaux³

et al. 1993

J Appl Cryst

Self Cite

119

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The INEL diffractometer, equipped with a CPS120 curved detector and set up in a Debye-Scherrer geometry, is a unique tool for carrying out powder diffraction studies on air-sensitive and/or smallvolume samples. Although it has routinely been used in powder diffractometry because of its minute acquisition times, its accuracy in d-spacing and intensity measurements has not been clearly demonstrated before now. Concerning the d spacings, proper linearization of the CPS120 with a cubic Na2Ca3AizF14 standard allowed a mean 620 difference of 0.006 ° . Intensity accuracy was measured with different highly and poorly absorbing samples. The accuracy is fairly good for the latter but poor for the former, except when special procedures such as the dilution of the sample with boron powder are used. A Rietveld calculation carried out on TI4V20 v showed a very good agreement between the INEL Debye-Scherrer-geometry results and those obtained with a Philips diffractometer and Bragg-Brentano geometry.

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Section: Linearandatandnmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Potential of the INEL X-ray position-sensitive detector: a general study of the Debye–Scherrer setting

Evain¹,

Deniard²,

Jouanneaux³

et al. 1993

J Appl Cryst

Self Cite

119

View full text Add to dashboard Cite

show abstract

“…The peak-by-peak analyses were performed with the PROLIX program (Deniard, Evain, Barbet & Brec, 1991) using pseudo-Voigt profile functions. Latticeparameter measurements were obtained by least-squares refinement from the d-spacing list with the U-FIT program (Evain, 1992).…”

Section: Data Processingmentioning

confidence: 99%

“…Indeed, the simplicity of the Debye-Scherrer setting is associated with the simultaneous collection of data over a large 20 angular range (120 ° for an INEL CPS 120), good counting statistics or with very short measuring time (Deniard, Evain, Barbet & Brec, 1991;Evain, Deniard, Jouanneaux & Brec, 1993), which is particularly interesting for phase transformations and kinetic studies (Plevert, Auffredic, LouEr & LouEr, 1989;Stfihl & Hanson, 1994;W61fel, 1983).…”

Section: Introductionmentioning

confidence: 99%

Reflection Asymmetric Powder Diffraction with Flat-Plate Sample using a Curved Position-Sensitive Detector (INEL CPS 120)

Masson¹,

Guinebretière²,

Dauger³

1996

J Appl Cryst

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The reflection flat-sample asymmetric geometry is an attractive set-up for powder diffraction measurements, as compared to either conventional Debye--Scherrer or symmetric Bragg-Brentano geometries. Combined with grazing-or fixed-incidence-angle X-rays, it is suitable for surface-structure or thin-film texture analysis. Furthermore, it allows curved position-sensitive detectors to be used for in situ experiments. In this paper, the major systematic error sources in connection with this geometry are reviewed. It is confirmed that experimental linearization of the curved position-sensitive detector and sample positioning have to be very carefully performed. Simple and automatable procedures are proposed. Then, it is shown that peak-location accuracy leads to satisfactory cell-parameter determination as checked by the use of a silicon international standard reference sample and that structure refinement by the Rietveld method can be performed in very good conditions, as observed with an NaBi2Sb3Oll compound.

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2007

X‐ray Diffraction by Polycrystalline Materials

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The INEL X-Ray Position Sensitive Detector: A Study of D-Spacing Accuracy and Exposure Time

Cited by 27 publications

References 0 publications

Potential of the INEL X-ray position-sensitive detector: a general study of the Debye–Scherrer setting

Potential of the INEL X-ray position-sensitive detector: a general study of the Debye–Scherrer setting

Reflection Asymmetric Powder Diffraction with Flat-Plate Sample using a Curved Position-Sensitive Detector (INEL CPS 120)

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