Earlier crystallographic refinements of naphthalene and anthracene against X-ray data recorded at five and six temperatures, respectively, have been repeated with atomic charge-deformation parameters transferred from a low-temperature study of perylene. Inclusion of these parameters causes the inplane molecular translation amplitudes to decrease, and those normal to the plane to increase, with respect to values obtained with the spherical-atom model. The revised translation tensors are systematically smaller than those predicted by published lattice-dynamical calculations but the librations agree somewhat better. Their temperature dependence shows no anomalous behavior and accords qualitatively with the simplified model ofCruickshank [Acta Cryst. (1956), 9, 1005-1009.
IntroductionIn fitting a set of model parameters to experimental data, as in crystal structure refinement, it is often advantageous to reduce the flexibility of the model by fixing those parameters that are better known, from theory or previous experiments, than they can be determined from the observed data. Thus, for macromolecular structures yielding low-resolution X-ray data, it is routine to simplify the structural t Deceased, 20 May 1991. model by constraining bond lengths and angles or fixing the geometry of such groups as phenyl substituents. Even the use of atomic scattering factors calculated for spherical atoms constitutes such a simplification. This practice has the great advantage that the structure factors can be calculated by summation over the atoms, with a few parameters per atom, rather than by integration over the electron density. However, it is well known that the sphericalatom approximation may produce severe systematic errors in the refined atomic parameters (Ruysink & Vos, 1974; Hirshfeld, 1976). A powerful way to eliminate such errors is to refine electron deformation (multipole) parameters together with the atomic coordinates and displacement parameters (Stewart, 1976; Hansen & Coppens, 1978; Hirshfeld, 1991), but such a refinement requires highly accurate and extensive X-ray data. What if the data available are inadequate for such a treatment? One possibility is to set the deformation parameters at their most likely values, estimated either from theoretical electron density distributions or from multipole analyses of chemically related molecules. The present study is an initial attempt in this direction. Its specific aim is to improve the temperature-dependent anisotropic displacement parameters (ADP's) of naphthalene between 92 and 239 K and of anthracene between 94 and 295 K that were derived by conventional least-squares analyses from X-ray data of moderate resolution .00 © 1991 International Union of Crystallography 790 TRANSFERABILITY OF DEFORMATION DENSITIES Dunitz, 1982. For this purpose we have introduced atomic multipole parameters transferred from a study of perylene based on much more extensive diffraction data (Hirshfeld, Hope & Rabinovich, to be published -hereafter HHR). These data, recorded at ...