Keywords: beam damage; electron microscopy; ultrafast electron microscopySignificance Statement: Specimen damage is a major limiting factor in electron microscopy. A 10 number of approaches exist for mitigating negative effects, but challenges remain. Advances in pulsed electron sources are intriguing, but little is known about the effects on damage, particularly when compared to conventional methods. Here, using a femtosecond pulsed laser to control electron emission and deliver each electron to the specimen in a regular, precisely-timed manner, the authors show that damage can be reduced compared to conventional approaches for 15 the same dose rate and total dose. Further, damage is shown to depend on the time between arrival of each electron and on the number of electrons arriving in a given amount of time, indicating specimen relaxation reduces the damage incurred.