The influence of crystallographic texture on diffraction measurements of residual stress

X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

“…4, where the unstressed lattice parameter d 0 was determined from the intercepts in the sin 2 plots. The biaxial rotational symmetric in-plane residual stress in the Laplace space ðÞ was determined from "ð200; ; Þ using Hooke's law as applied in the X-ray diffraction residual stress analysis according to (Genzel, 1997;Birkholz, 2006) ðÞ ¼ "ð200; ; Þ=Fð200; Þ; ð3Þ where Fð200; Þ represents X-ray stress factors which depend on the material texture, single-crystal elastic constants, grain interaction, the TiN 200 reflection and the orientation of the diffraction vector (Dö lle, 1979;Houtte & Buyser, 1993). Since the TiN thin films were in-plane isotropic and possessed a {100} fibre texture (Fig.…”

Heterogeneous Deformation in Single‐Phase Zircaloy 2

“…These can, respectively, be taken as resistance to elastic and plastic deformation. As shown in To expand the picture of heterogeneous deformation further, residual stress values were measured for different goniometer angles and for the respective poles of (0 0 0 4), ð0 1 1 4Þ, ð0 1 1 5Þ and ð1 1 2 4Þ in an Eulerian texture cradle [16,[20][21][22]. In general, near basal orientations had more residual stress (five times or more) and Figure 6 plots the compressive residual stress distribution in the / 2 = 0°section.…”

“…The EBSD were performed using a TSL-OIM package on a Fei quanta-200 HV scanning electron microscope (SEM), while a panalytical MRD system was used for XRD measurements. Instead of measuring relative intensity, as in the case of conventional X-ray texture, the residual stress values were estimated using Reuss's model according to a methodology described elsewhere [16], at different goniometer angles. Using four different pole figures (of residual stress values) and the WMIV method [17], residual stress distribution functions were calculated.…”

Numerical simulation of the X-ray stress analysis technique in polycrystalline materials under elastic loading

“…On the other hand, analyzing multiple reflections may yield stress values that approach the limit defined by Eq. [21]. By monitoring the change in the value of the average with the addition of new reflections, one might be able to obtain a good approximation of the global stress in the irradiated volume.…”

“…[8,[20][21][22][23] In general, however, these formulations also contain simplifying assumptions and have been mainly aimed at solving the problems of stress/strain determination in textured materials. [21,23] An added problem with analytical solutions is the absence of local data, since, in most cases, the derivations yield directly an average stress or strain tensor over a set of crystallites with a particular distribution. Consequently, the relationships between the local stresses/strains in the diffracting crystallites and the global averages obtained from the diffraction analysis are still not well established.…”