2005
DOI: 10.1016/j.renene.2004.03.012
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The influence of defects on short circuit current density in p-i-n silicon solar cell

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Cited by 4 publications
(3 citation statements)
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“…This value is unacceptably high for most solar cells because high-density defects severely reduce the carrier collection efficiency. 28 This value indicates that PSCs have very high tolerance to defects.…”
Section: Broader Contextmentioning
confidence: 99%
“…This value is unacceptably high for most solar cells because high-density defects severely reduce the carrier collection efficiency. 28 This value indicates that PSCs have very high tolerance to defects.…”
Section: Broader Contextmentioning
confidence: 99%
“…Evidently the introduction of oxide layer increases the total absorption depth. This in turn utilizes the wasted portion of the solar spectrum, consequently increases the short circuit current [15,16].…”
Section: Laboratory Preparationmentioning
confidence: 99%
“…2 order to determine optimal thickness of i-layer of a cell, the admittance analysis method had been used to calculate the collection efficiency and the J sc in a-Si:H p-i-n solar cell as a function of the thickness of i-layer. 3 In other words, achieving higher efficiency should not be the only objective, but also it requires assessment of economic aspects for a device fabrication.…”
mentioning
confidence: 99%