2012 IEEE International Conference on Condition Monitoring and Diagnosis 2012
DOI: 10.1109/cmd.2012.6416460
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The influence of free moving particles on the breakdown voltage of GIS under different electrical stresses

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Cited by 14 publications
(3 citation statements)
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“…This kind of MODELS usage together with controlled time‐dependent resistor element R ( t ) [4, 12, 14] were widely applied in dynamic TNM modelling. Cross‐section of the analysed cases (model 1, model 2 and model 3) and drawings diagrams with simulation results are presented in Fig.…”
Section: Thermal Analyses Description and Simulation Resultsmentioning
confidence: 99%
“…This kind of MODELS usage together with controlled time‐dependent resistor element R ( t ) [4, 12, 14] were widely applied in dynamic TNM modelling. Cross‐section of the analysed cases (model 1, model 2 and model 3) and drawings diagrams with simulation results are presented in Fig.…”
Section: Thermal Analyses Description and Simulation Resultsmentioning
confidence: 99%
“…As a result, the breakdown voltage of particles under 10mm gap distance is lower than that of the breakdown voltage of particles under 15mm gap distance. Existing research has shown that the breakdown voltage and gap distance of metal particles are positively correlated [45].…”
Section: ) R410a Breakdown Performance With Copper Particlesmentioning
confidence: 99%
“…Free-metal particles defect in GIS devices was were simulated by 20 six-series aluminum alloy balls with a diameter of 3 mm [13], which are located in a spherical bowl electrode, as shown in Figure 2a. The bowl was cut with a hollow stainless steel sphere (Φ = 100 mm).…”
Section: Defect Modelmentioning
confidence: 99%