The Influence of Image Processing and Layer-to-Background Contrast on the Reliability of Flatbed Scanner-Based Characterisation of Additively Manufactured Layer Contours

Abstract

Flatbed scanners (FBSs) provide non-contact scanning capabilities that could be used for the on-machine verification of layer contours in additive manufacturing (AM) processes. Layer-wise contour deviation assessment could be critical for dimensional and geometrical quality improvement of AM parts, because it would allow for close-loop error compensation strategies. Nevertheless, contour characterisation feasibility faces many challenges, such as image distortion compensation or edge detection quality. The present work evaluates the influence of image processing and layer-to-background contrast characteristics upon contour reconstruction quality, under a metrological perspective. Considered factors include noise filtering, edge detection algorithms, and threshold levels, whereas the distance between the target layer and the background is used to generate different contrast scenarios. Completeness of contour reconstruction is evaluated by means of a coverage factor, whereas its accuracy is determined by comparison with a reference contour digitised in a coordinate measuring machine. Results show that a reliable contour characterisation can be achieved by means of a precise adjustment of image processing parameters under low layer-to-background contrast variability. Conversely, under anisotropic contrast conditions, the quality of contour reconstruction severely drops, and the compromise between coverage and accuracy becomes unbalanced. These findings indicate that FBS-based characterisation of AM layers will demand developing strategies that minimise the influence of anisotropy in layer-to-background contrast.

Special Issue on Intelligent Processing on Image and Optical Information II

“…The paper entitled 'The Influence of Image Processing and Layer-to-Background Contrast on the Reliability of Flatbed Scanner-Based Characterisation of Additively Manufactured Layer Contours' by David Blanco, Pedro Fernández, Alejandro Fernández, Braulio J. Alvarez, and José Carlos Rico [16] evaluates the influence of image processing and layer-to-background contrast characteristics upon contour reconstruction quality under a metrological perspective.…”

Algorithm for extracting contours of agricultural crops images

“…It depends on the fact that the contours of the image objects are clearly and completely obtained without various noises and distortions, as well as the contrast is at a normal level. Too much noise creates false contours [3]. Insufficient contrast prevents contours from being clearly and completely captured.…”