The compound Ba 0.615 Sr 0.35 Mg 0.035 TiO 3 was analyzed by the X-ray dispersed spectroscopy analyzer (SEM-EDAX) with the spectrum image method, a powerful tool for chemical phase identification. The method was first time applied on a ceramic material to collect spectrum image and was progressed to identify the Mg-enriched component with fine scale pocket shown in matrix. This result, together with the stoichiometry result obtained from spot mode spectrum analysis, strongly confirmed the microstructure and properties of dielectric materials. Barium strontium titanate (BST) materials have shown the great potential for dielectric applications because of their high tenability and low dielectric losses [1]. In the BST system, the additive of MgO or Mg doping in BST ceramics will change the perovskite ABO 3 structure of BST, which leads to the significant suppression of permittivity and losses [2,3]. However, the solubility limit of Mg content in the BST ceramics will affect the microstructure and dielectric properties of BST ceramics [2,4,5]. Because of the low levels of the additives, it is necessary to directly detect the distribution of complex components in the materials. Energy dispersive X-ray spectrum (EDS) mapping, in which the complete X-ray spectrum is collected at every pixel in the sample, is a new and powerful tool for materials characterization [6][7][8][9]. Spectrum mapping is different from the conventional element mapping (regions of interest mapping, ROI mapping), in which only windows around preselected energy ranges are acquired and only the chosen elements are showed. In the spectrum mapping method, the entire spectrum information is collected at each pixel in spectrum mapping as the beam is rastered across the specimen [7]. This technology allows even unexpected elemental features to be detected after data has been collected. Additionally, the elemental distribution and a corresponding image describing the distribution for each chemical component in the microstructure are offered with this new analysis tool [9]. The new class of energy dispersive X-ray spectrometer, the silicon drift detector (SDD) with less accumulation time and better energy resolution [6,10,11] than the conventional Si-EDS, make it possible to get the compositional nature of the materials with the spectrum imaging analysis.Although some studies on the diffusion of components of alloy [12,13] and the chemical phases segregation near the interface in the metal-ceramic braze [14] by X-ray spectrum analysis, the composition and phase distribution of compound ceramics are not statistically analyzed with this new and efficient spectrum image analysis. In this paper, the microstructure of Ba 0.615 Sr 0.35 Mg 0.035 TiO 3 ceramics is studied with X-ray spectrum mapping techniques, which are used to describe the chemical composition and distribution of the phase in Mg doping BST dielectric ceramics.