1999
DOI: 10.1088/0953-8984/11/7/009
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The influence of microstructure on the sintering process in crystalline metal powders investigated by positron lifetime spectroscopy: I. Electrolytic and spherical copper powders

Abstract: We investigate the influence of microstructure (dislocations, and grain and subgrain boundaries) on the sintering process in compacts of electrolytic and spherical copper powders by means of positron lifetime spectroscopy. We compare the lifetime data obtained to the kinetics of the annealing out of vacancy clusters after low-temperature electron irradiation, and the kinetics of recovery and recrystallization after plastic deformation. The change of powder-particle and grain sizes with temperature is determine… Show more

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Cited by 28 publications
(35 citation statements)
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“…The lifetime spectrum of positrons for this sample was found to be 116Ϯ1 ps. This value agrees with the lifetime of positrons annihilated from the free state, [12][13][14][15][16][17] suggesting that the S value obtained for the annealed Cu͑5N͒ sample is close to the characteristic value of S for defect-free Cu (S f ). In Fig.…”
Section: A Behavior Of Positrons In Electroplated Cu Films On Si Waferssupporting
confidence: 79%
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“…The lifetime spectrum of positrons for this sample was found to be 116Ϯ1 ps. This value agrees with the lifetime of positrons annihilated from the free state, [12][13][14][15][16][17] suggesting that the S value obtained for the annealed Cu͑5N͒ sample is close to the characteristic value of S for defect-free Cu (S f ). In Fig.…”
Section: A Behavior Of Positrons In Electroplated Cu Films On Si Waferssupporting
confidence: 79%
“…This lifetime agrees with that for deformed Cu reported previously. 12,16 It is well known that plastic deformation of Cu introduces two types of defects: dislocations, and vacancies introduced by dislocation movements, such as dislocation intersection and jog dragging. These vacancies are considered to locate adjacent to dislocation lines.…”
Section: A Behavior Of Positrons In Electroplated Cu Films On Si Wafersmentioning
confidence: 99%
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“…These results are similar to those obtained in other metals after sintering. 47 The first lifetime is attributed to annihilation inside grains, i.e., in material which is mostly free of defects whereas the long second lifetime is due to large open volume associated with grain boundaries. According to the theoretical calculations ͑Table I͒, the lifetime corresponds to an open volume of at least four vacancies in As.…”
Section: Positron Trapping At As-precipitates In Annealed Lt-gaasmentioning
confidence: 99%