“…The suitability of the localized piezoelectrically induced detrapping model of EML becomes evident from the following facts: (i) the piezoelectric constant is higher near the defect centers [35], (ii) although ZnS is piezoelectric, it shows EML only in the presence of particular dopants such as Mn 2 þ , and it does not show EML in pure form and also for the Cu 1 þ or Ag 1 þ dopants, (iii) several crystals exhibit FML and EML in impure form and when they are purified, they do not show ML [1,9,[36][37][38], (iv) generally, the crystals show EML only in the presence of particular activator ions, (v) only the piezoelectric phase of Eu 2 þ -doped strontium aluminates shows EML and the nonpiezoelectric phases do not show EML and (vi) according to the localized piezoelectrically induced detrapping model, the total EML intensity should increase quadratically with the applied pressure, which is fairly in accord with the experimental observation.…”